Antifuse Structure Ring Gate High Dopant Conductivity

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Solution Overview

Problem

The existing antifuse structures in integration circuit fabrication lack improved conductive properties, which hinders their effectiveness in fault tolerance and one-time programming applications.

Innovation Solution

The antifuse structure incorporates a ring-shaped gate electrode with a portion overlapped by an active area having a higher dopant concentration, along with a dielectric layer sandwiched between the active area and the gate electrode, and additional features such as isolation structures, conductive vias, and doped well regions to enhance conductive properties.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional antifuse structure with two conductors separated by an insulator is used, then the structure provides basic fault tolerance functionality, but the conductive properties are insufficient

Engineering Contradiction:
Improveconductive propertiesVSAvoidstructure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent introduces a non-uniform dopant concentration distribution in the active area, with a first region having a different dopant concentration than a second region. This local quality variation enhances the conductive properties of the antifuse structure without requiring complete structural redesign, thereby improving reliability while controlling complexity.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent adds a vertical dimension to the dopant concentration profile by creating distinct dopant concentration levels at different regions of the active area. This dimensional approach to doping creates enhanced conductive pathways that improve the antifuse's conductive properties without significantly increasing lateral structural complexity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If the dopant concentration is increased to improve conductive properties, then the electrical conductivity improves, but the manufacturing precision requirements increase

Engineering Contradiction:
Improveelectrical conductivityVSAvoiddopant concentration control
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The active area is segmented into at least two distinct regions with different dopant concentrations. This segmentation allows each region to be optimized for specific electrical properties, improving overall conductive performance while enabling more manageable control of dopant concentrations in discrete zones rather than requiring uniform precision across the entire structure.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration significantly improves the conductive properties of the antifuse structure, enabling better performance in fault tolerance and one-time programming by optimizing the electrical conductivity and structural design.

Implementation Method 1

When the programming voltage is applied, the insulator undergoes a dielectric breakdown process

Methodology Applied
Scientific EffectDielectric breakdown: Avalanche Breakdown

Implementation Method 2

a leakage current increases and a thermal runaway condition develops, melting the insulator and adjacent conductive materials

Methodology Applied
Scientific EffectThermal runaway: Joule Heating

Data Source

PatentUS20220059456A1Antifuse structure
Publication Date: 2022.02.24 NAN YA TECH
  • US20220059456A1 patent drawing
  • US20220059456A1 patent drawing

AI summary

An antifuse structure includes an active area, a gate electrode and a dielectric layer. The gate electrode is over the active area, in which the gate electrode is ring-shaped, and a portion of the gate electrode is overlapped with a portion of the active area in a vertical projection direction, and the portion of the active area has a dopant concentration higher than a dopant concentration of another portion of the active area. The dielectric layer is sandwiched between the portion of the active area and the portion of the gate electrode.