APD Image Correction for Defective Pixel Miscounting
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Solution Overview
Problem
Existing photoelectric conversion apparatuses with avalanche photodiodes (APDs) suffer from image quality deterioration due to miscounting caused by defective pixels resulting from various causes, including light-emission crosstalk, which is corrected using a single method, leading to further degradation.
Innovation Solution
A processing apparatus and method that distinguishes between different types of defective pixels based on their causes, applying distinct correction processing for each type to minimize miscounting and maintain image quality, utilizing a correction processing unit that executes first and second correction processing for pixels in the surrounding areas of first and second type defective pixels, respectively.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a single correction method is applied to all defective pixels, then light-emission crosstalk can be corrected, but image quality deteriorates due to erroneous corrections on defective pixels caused by other factors
Solution Approach 1:
The patent segments defective pixels into multiple types based on their causes (light-emission crosstalk vs. other factors). By dividing the correction approach into type-specific methods, the system applies correction only where appropriate, avoiding erroneous corrections that would degrade image quality.
Solution Approach 2:
The patent applies different correction qualities to different regions (types of defective pixels). Instead of a uniform correction approach, each defective pixel type receives a tailored correction method, ensuring that correction is applied locally and appropriately rather than globally and uniformly.
2Measurement precision
If correction processing is applied to all defective pixels, then miscounting due to light-emission crosstalk is reduced, but miscounting may increase due to erroneous corrections on other defective pixel types
Solution Approach 1:
The patent segments the correction process into multiple pathways based on defective pixel type identification. This segmentation ensures that correction operations are performed with high precision only on pixels where they are appropriate, while avoiding corrections that would reduce reliability.
Solution Approach 2:
The patent changes the correction parameters (whether to apply correction and what correction method to use) based on the identified type of defective pixel. This parameter adaptation allows the system to optimize both measurement precision and correction reliability by adjusting correction behavior to match the specific defect type.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The approach effectively reduces cluster defects by tailoring correction processing for each type of defective pixel, thereby preserving image quality and minimizing erroneous corrections.
Implementation Method 1
a photoelectric conversion element that has an avalanche photodiode, converts light from a subject into an electrical signal
Implementation Method 2
a phenomenon called avalanche light emission occurs in a photoelectric conversion apparatus having an APD. When avalanche light emission occurs, secondary electrons that are generated are incident on adjacent pixels
Data Source
AI summary
A processing apparatus for generating and correcting an image based on a count value output by a photoelectric conversion element that has an avalanche photodiode, converts light from a subject into an electrical signal, counts the electrical signal, and outputs the count value, the processing apparatus generates a first image based on the count value, and executes correction processing for correcting the first image, wherein the correction processing includes first correction processing for a first pixel including a pixel in a surrounding area of a first type of defective pixel in which miscounting occurs due to a first cause, and second correction processing different from the first correction processing for a second pixel including a pixel in a surrounding area of a second type of defective pixel in which miscounting occurs due to a second cause different from the first cause.