Aperture Array Fixing Instrument for Spectrometry
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Solution Overview
Problem
The existing metal mesh devices for spectrometry suffer from insufficient fixing of aperture arrays due to variations in molding accuracy, leading to creases and deflection, which result in measurement errors and reduced sensitivity and reproducibility.
Innovation Solution
A fixing instrument with first and second frame members that clamp the outer peripheral section of the aperture array, featuring specific cavity and flange designs to ensure secure clamping, with dimensions satisfying conditions that prioritize A1+C > B1 and A2+C > B2, to prevent bending and creasing, allowing for high sensitivity and reproducibility in spectrometric measurements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If the aperture array is held on a stage of a spectroscope, then the measurement can be performed, but the aperture array is bent or creased causing measurement errors
Solution Approach 1:
The aperture array is divided into two functional sections: an aperture array section with apertures for measurement and an outer peripheral section for fixation. This segmentation allows the peripheral section to be clamped by frame members without affecting the measurement function of the aperture section, preventing bending and creasing while maintaining measurement capability
Solution Approach 2:
Frame members are introduced as intermediary components to clamp the outer peripheral section of the aperture array. These frame members act as a mediator between the aperture array and the measurement system, providing stable support and preventing direct contact between the aperture array and the spectroscope stage that would cause bending
2Stability of the object's composition
If frame members are used to clamp the aperture array, then bending and creasing are suppressed, but fixing is insufficient due to variations in molding accuracy
Solution Approach 1:
The design parameters of the frame members are optimized to ensure reliable fixing despite molding variations. The first and second frame members are designed with specific dimensional relationships (A1+C>B1 and A2+C>B2) that provide sufficient clamping force and tolerance compensation, maintaining both flatness and fixing reliability
Solution Approach 2:
The frame member design incorporates built-in tolerance compensation through dimensional relationships that anticipate molding variations. By designing A1+C>B1 and A2+C>B2, the structure provides a buffer zone that compensates for potential molding inaccuracies before they can affect the fixing reliability
3Measurement precision
If the thickness of the aperture array is decreased for high-frequency measurement, then measurement sensitivity increases, but the aperture array becomes more prone to bending and creasing
Solution Approach 1:
The aperture array is segmented into a thin aperture array section for high-frequency measurement and a separate outer peripheral section for structural support. This allows the main measurement area to be optimized for sensitivity with reduced thickness while the peripheral section provides mechanical strength to prevent bending
Solution Approach 2:
Frame members serve as intermediary support structures that compensate for the reduced structural rigidity of the thin aperture array. By clamping the outer peripheral section, the frame members provide the necessary mechanical support to prevent bending and creasing while allowing the aperture section to maintain its optimized thin profile for high-frequency measurement
Data Source
AI summary
A fixing instrument includes a first frame member (2) and a second frame member (3) that clamp and fix an aperture array structure. At least any of conditions of Expression 1: A1+C>B1 and Expression 2: A2+C>B2 is satisfied where A1 represents a distance between a first reference surface (22a) and a first inner peripheral fitting face (21a), A2 represents a distance between the first reference surface (22a) and a first outer peripheral fitting face (21b), B1 represents a distance between a second reference surface (32a) and a second inner peripheral fitting face (31a), B2 represents a distance between the second reference surface (32a) and a second outer peripheral fitting face (31b), and C represents a thickness of an outer peripheral section (102) of the aperture array structure.