Aperture Array Reflection Spectroscopy for Minute Specimens

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Solution Overview

Problem

Existing methods for measuring specimen characteristics, especially when the specimen amount is minute, face challenges in sensitivity and efficiency due to the reliance on changes in frequency characteristics caused by interactions near the surface of aperture array structures, which are often insufficient for detecting subtle changes.

Innovation Solution

A method involving an aperture array structure where a liquid is attached to one principal surface and an electromagnetic wave is applied from the opposite surface, allowing for the detection of frequency characteristics of the reflected wave, which changes based on the specimen's characteristics such as presence, amount, surface roughness, and film thickness, enhancing sensitivity and efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If electromagnetic wave transmittance is used to detect specimen characteristics, then measurement can be performed, but sensitivity is insufficient when specimen amount is minute

Engineering Contradiction:
Improvespecimen characteristic detection sensitivityVSAvoidspecimen amount
Core Design Contradiction:
Measurement precisionVSQuantity of substance

Solution Approach 1:

The invention changes the measurement parameter from transmittance to reflectance. By measuring the reflected electromagnetic wave instead of the transmitted wave, the system achieves higher sensitivity for detecting minute specimen amounts. The reflectance measurement captures interactions at the specimen-aperture array interface more effectively, enabling detection of small changes in specimen characteristics even when the specimen amount is minimal.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If liquid is allowed to penetrate apertures for measurement, then contact with specimen is improved, but liquid leakage occurs to the opposite side

Engineering Contradiction:
Improveliquid-specimen contact reliabilityVSAvoidliquid leakage
Core Design Contradiction:
ReliabilityVSLoss of substance

Solution Approach 1:

The invention applies local quality by making the aperture array structure hydrophobic at specific locations. The hydrophobic treatment is applied selectively to the aperture array structure to control liquid behavior. This creates regions with different wetting properties, allowing the liquid to maintain reliable contact with the specimen at the intended measurement interface while preventing unwanted penetration and leakage to the opposite side through the hydrophobic barrier effect.

Inventive Principle:
Principle #3Local quality

3Measurement precision

If contact angle meter with camera is used to measure liquid characteristics, then wetness can be measured, but additional equipment increases cost and other characteristics cannot be measured simultaneously

Engineering Contradiction:
Improveliquid wetness measurementVSAvoidmeasurement equipment
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The invention implements multi-functionality by using a single electromagnetic wave measurement system to detect multiple specimen and liquid characteristics simultaneously. The reflectance measurement approach can characterize specimen properties (presence, amount, surface roughness, film thickness) and liquid properties (wetness, surface tension effects) in one measurement, eliminating the need for separate contact angle meter and camera equipment while providing comprehensive characterization.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables high-sensitivity and high-efficiency measurement of specimen characteristics even when the specimen amount is minimal, by leveraging changes in the liquid's behavior on the aperture array structure, such as surface tension and sinking behavior, to amplify the detectable frequency changes.

Implementation Method 1

detecting frequency characteristics of the electromagnetic wave reflected by the aperture array structure

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 2

leveraging changes in the liquid's behavior on the aperture array structure, such as surface tension and sinking behavior

Methodology Applied
Scientific EffectSurface tension: Surface Tension

Implementation Method 3

a degree of sinking of the liquid into the apertures of the aperture array structure being changed by characteristics of the specimen

Methodology Applied
Scientific EffectCapillary action: Capillary Action

Data Source

PatentEP2717037B1Spectroscopic measurement method in reflection geometry
Publication Date: 2019.06.12 MURATA MFG CO LTD
  • EP2717037B1 patent drawingFigure 1
  • EP2717037B1 patent drawingFigure 2~3
  • EP2717037B1 patent drawingFigure 4~5

AI summary

The present invention provides a measuring method for measuring characteristics of a specimen (2) to be measured by holding the specimen (2) on an aperture array structure (1) having apertures (10), applying an electromagnetic wave to the aperture array structure (1), and detecting frequency characteristics of the electromagnetic wave reflected by the aperture array structure (1), wherein the measuring method includes the steps of attaching a liquid (3) directly or indirectly to at least a part of a first principal surface that is one of principal surfaces of the aperture array structure (1), and applying the electromagnetic wave from side including a second principal surface that is the other principal surface of the aperture array structure (1), the apertures (10) of the aperture array structure (1) have size not allowing the liquid (3) to leak from the first principal surface side to the second principal surface side, and the liquid (3) is attached to the first principal surface of the aperture array structure (1) in a state opened to an atmosphere under air pressure.