Multi-Layer Structure Evaluation via Aperture-Based Electromagnetic Sensing
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Solution Overview
Problem
Evaluating layers and interlayer gaps in multi-layer structures is challenging without access to free edges or known layer thicknesses, as existing methods require edge access for accurate measurement.
Innovation Solution
An apparatus and method using a sensing unit, positioning unit, and control unit to move along the axis of a multi-layer structure, monitoring changes in parameters such as electromagnetic properties to determine layer thicknesses and interlayer gaps, generating a map for evaluation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If edge evaluation methods are used to measure layers, then measurement accessibility is improved, but the method becomes inapplicable when free edges are not presented
Solution Approach 1:
The patent transitions from edge-based measurement (2D surface evaluation) to through-aperture measurement (3D internal evaluation). The sensing unit is moved through an aperture that traverses the multi-layer structure, allowing measurement of layer thicknesses and interlayer gaps from the interior rather than requiring edge access. This dimensional change enables measurement in situations where free edges are not presented.
2Measurement precision
If traditional measurement methods requiring known thicknesses are used, then measurement accuracy is improved, but the method becomes inapplicable when layer thicknesses are unknown
Solution Approach 1:
The patent replaces mechanical contact measurement methods with electromagnetic sensing. The sensing unit employs electromagnetic fields to detect layer boundaries and measure thicknesses without requiring prior knowledge of dimensions. This substitution enables accurate measurement even when layer thicknesses are completely unknown, as the electromagnetic sensor can detect changes in material properties at layer interfaces.
3Device complexity
If edge access is required for layer evaluation, then the evaluation process is simplified, but the method cannot be applied to sealed or embedded structures
Solution Approach 1:
The patent introduces an aperture as an intermediary access path through which the sensing unit can traverse the multi-layer structure. This aperture serves as a mediator that allows internal measurement without requiring external edge access. The aperture may be an existing fastener hole or a specifically created test aperture, providing a pathway into the sealed or embedded structure for evaluation purposes.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate measurement and evaluation of layers and interlayer gaps without requiring access to free edges, providing detailed thickness and gap information for stress analysis and other evaluations.
Implementation Method 1
an electromagnetic sensor unit configured for sensing at least one electromagnetic parameter
Data Source
AI summary
An apparatus for evaluating layers, including interlayer gaps, in a multi-layer structure; the multi-layer structure presenting a plurality of edges generally aligned athwart an axis; the apparatus includes: (a) a sensing unit configured for sensing at least one parameter; (b) a positioning unit coupled with the sensing unit; the positioning unit being configured to effect moving the sensing unit generally along the axis; and (c) a control unit coupled with at least one of the positioning unit and the sensing unit. The control unit provides an electrical signal to the sensing unit. The control unit monitors changes in the at least one parameter as the sensing unit moves past the plurality of edges. The control unit employs the changes in the at least one parameter to effect the evaluating.