AR Waveguide Projector Alignment via Aperture Calibration

The patent introduces an intermediary alignment target with reference features that mediates between the projector and waveguide alignment process. The target includes specific reference points and features that provide visual feedback during alignment, making the alignment process detectable and measurable without requiring complex measurement equipment. This intermediary target enables precise alignment by providing clear visual indicators of the projector's position relative to the waveguide.

The patent merges the alignment process of multiple projectors into a unified procedure by using a common alignment target that includes reference features for all projectors. The target consolidates multiple alignment requirements into a single visual reference system, allowing technicians to align multiple projectors simultaneously with respect to a common origin point. This merging approach ensures that all projectors converge on the same image plane while still allowing individual optimization of each projector's performance.

The patent uses a simplified visual copy of the alignment target with reference features that replicates the essential alignment information in an easily manufacturable format. Instead of requiring complex measurement equipment, the system creates a visual copy/target that can be easily printed or fabricated and provides sufficient reference information for precise alignment. This visual copy approach maintains measurement precision while dramatically simplifying the manufacturing and assembly process, as the target can be easily produced and integrated into the device.