Arrangement Unit Dynamic Scheduling for Testing Idle Time Reduction
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Solution Overview
Problem
Traditional testing methods result in increased idle time and overall time consumption for testing devices due to sequential testing and the need for devices to wait for the longest testing time to complete, leading to inefficient use of testing resources.
Innovation Solution
A testing system and method that includes an arrangement unit connected to multiple testing devices, which detects idle states and generates instructions to allocate testing items to available devices, allowing for simultaneous testing and reducing idle time through dynamic scheduling.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If sequential testing is used to ensure proper testing flow, then testing completeness is improved, but total idle time of testing devices increases
Solution Approach 1:
The patent implements dynamic testing flow adjustment by allowing the system to change the execution sequence of testing items based on real-time device idle states. The arrangement unit dynamically assigns testing items to available devices rather than following a fixed sequential order, resolving the contradiction between maintaining testing completeness and reducing idle time.
Solution Approach 2:
The system performs preliminary detection of device idle states and pre-assigns testing items to devices before they become available. By detecting idle states in advance and preparing testing item assignments beforehand, the system ensures that devices can immediately begin testing when available, reducing idle time while maintaining proper testing flow.
2Reliability
If time slots are set based on the longest testing time to ensure all devices can complete testing, then testing coverage is improved, but time consumption of the testing process increases
Solution Approach 1:
The patent replaces fixed time slot allocation with dynamic testing assignment. Instead of setting time slots based on the maximum testing duration, the system continuously monitors device availability and assigns testing items in real-time, allowing the testing schedule to adapt dynamically to actual device performance and availability.
Solution Approach 2:
The system changes the scheduling parameter from fixed time slot duration to variable assignment timing. By adjusting when testing items are assigned based on actual device idle states rather than predetermined time slots, the system optimizes both testing coverage and overall time consumption.
3Ease of operation
If devices wait for the longest testing time to complete before continuing, then proper resource allocation is improved, but productivity of the testing process decreases
Solution Approach 1:
The system enables testing devices to independently begin testing when they become available, without requiring centralized coordination or waiting for other devices. Each device monitors its own idle state and automatically accepts and executes testing items assigned to it, improving both resource allocation efficiency and testing throughput.
Solution Approach 2:
The arrangement unit continuously receives feedback from testing devices about their idle states and dynamically adjusts testing item assignments accordingly. This real-time feedback mechanism ensures that resources are allocated efficiently to available devices, maximizing testing throughput while maintaining proper resource distribution.
Data Source
AI summary
A testing system is suitable for receiving at least one testing item of multiple device under tests (DUTs). The testing system comprises a plurality of testing devices and an arrangement unit. The arrangement unit is coupled to the testing devices. The arrangement unit generates at least one testing instruction according to the at least one testing item and detects an idle state corresponding to the at least one testing instruction, and transmits the at least one testing instruction to the testing device in the idle state, so as to trigger the testing device in the idle state to test the corresponding DUT according to the at least one testing instruction and generate a testing result.