Array Description System for Lithography Mirror Control

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Solution Overview

Problem

Lithography systems with large mirror arrays face challenges in controlling these arrays effectively, leading to difficulties in transferring complex patterns onto semiconductor wafers with precision and efficiency.

Innovation Solution

A compact mathematical array description system is developed, utilizing a library of alternative designations to succinctly describe the arrangement and phase of mirror elements, allowing for precise control and reduced data processing, enabling efficient transfer of patterns onto semiconductor wafers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If traditional control methods are used for large mirror arrays, then the system structure is simple, but the control precision and efficiency deteriorate

Engineering Contradiction:
Improvecontrol precisionVSAvoidsystem complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent divides the large mirror array into multiple sub-arrays or groups, each controlled by separate control electrodes. This segmentation allows independent optimization of control signals for different regions, improving overall control precision while managing system complexity through modular control architecture

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements dynamic control of mirror array elements by applying time-varying voltages to control electrodes, enabling real-time adjustment of mirror positions and orientations. This dynamic control approach enhances precision by adapting to changing operational requirements while maintaining manageable system complexity through software-based control algorithms

Inventive Principle:
Principle #15Dynamics

2Manufacturing precision

If detailed control of each mirror element is implemented, then control precision improves, but data processing time increases

Engineering Contradiction:
Improvepattern transfer precisionVSAvoidcomputation time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The patent combines control signals for multiple mirror elements by applying the same voltage pattern across groups of mirrors that need to move together. This merging approach reduces the total number of independent control operations required, decreasing computation time while maintaining precision through coordinated group control

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent applies control signals to only those mirror elements that need adjustment for the current patterning operation, rather than controlling every element in the array. This partial action approach reduces data processing time by focusing computational resources on relevant subsets of the mirror array while maintaining precision where needed

Inventive Principle:
Principle #16Partial or excessive action

3Manufacturing precision

If comprehensive control data is stored for all mirror elements, then control accuracy improves, but data storage requirements increase

Engineering Contradiction:
Improvearray control accuracyVSAvoiddata storage volume
Core Design Contradiction:
Manufacturing precisionVSQuantity of substance

Solution Approach 1:

The patent uses lookup tables that store pre-calculated control voltage patterns for common mirror array configurations. Instead of storing comprehensive control data for every possible individual element state, the system stores condensed representative patterns that can be quickly retrieved and applied, reducing storage requirements while maintaining control accuracy

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent transforms detailed individual element control data into condensed parameter-based descriptions that define groups of mirrors with similar control requirements. By storing and manipulating these condensed parameters rather than full-element data, the system reduces storage volume while preserving the ability to achieve precise control through parameter expansion during operation

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS11086231B2Array description system for large patterns
Publication Date: 2021.08.10 NIKON CORP
  • US11086231B2 patent drawing
  • US11086231B2 patent drawing
  • US11086231B2 patent drawing

AI summary

A method for describing an array of elements includes the steps of providing an array description system that includes a library of possible alternative designations; and describing the array of elements using at least one of the alternative designations. The library of possible alternative designations includes one or more of the following (i) a line designation, (ii) a column designation, (iii) a square designation, (iv) a rectangle designation, (v) a cross designation, (vi) a diagonal designation, (vii) a complex designation, (viii) a mosaic designation, (ix) an overlap designation, (x) a power designation, (xi) a border designation, (xii) a corner flip designation, (xiii) a mirror image designation, (xiv) a repeat designation, and (xv) a glide designation.