Array Test Pad Layout for Expanding Signal Channels Reliably
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Solution Overview
Problem
Conventional methods for expanding signal channels in array testers, such as increasing the number of PADs on a single ATS, result in smaller PAD sizes and increased test jig contact failures due to longer contacts and higher failure frequencies.
Innovation Solution
A signal channel expanding system using additional sets of array test pads on the periphery of the motherboard, with each pad having multiple pins, allowing for increased signal channels without altering the PAD size or extending the test jig.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If the number of PADs on a single ATS PAD is increased to double signal channels, then the number of signal channels is improved, but the PAD size becomes smaller causing partial test pad contact
Solution Approach 1:
The invention divides the single ATS PAD into multiple separate ATS PADs (at least two left driving ATS PADs and at least two right driving ATS PADs). Each ATS PAD maintains its original size and contact characteristics, while the collective system provides the required number of signal channels. This segmentation resolves the contradiction by preserving individual PAD quality while achieving the needed quantity through multiplication of separate units.
2Quantity of substance
If the number of PADs in a set of ATS PAD is increased to double signal channels, then the number of signal channels is improved, but the test jig contact becomes longer increasing failure frequency
Solution Approach 1:
Instead of increasing the number of PADs in a single linear set (one-dimensional expansion), the invention distributes PADs across multiple separate ATS PADs positioned at different locations (left driving and right driving sides). This spatial distribution in multiple dimensions allows the test jig to access PADs through shorter, more direct paths, resolving the contradiction between achieving more signal channels and maintaining short contact lengths.
Data Source
AI summary
A signal channel expanding system based on PAD is provided, including a motherboard disposed on an array tester and a plurality of array test pads disposed on a periphery of the motherboard and configured to control the motherboard; each of the array test pads includes a plurality of pins, each of the pins corresponds to a signal channel, the array test pads include at least two left driving array test pads and at least two right driving array test pads. Compared with the related art, in the signal channel expanding system based on PAD in the disclosure, by using at least two left driving array test pads and at least two right driving array test pads on the periphery of the motherboard, the number of the pins on the periphery of the motherboard can be multiplied and the pin size can remain unchanged without lengthening the test jig.