Array Substrate Alignment Mark Layout Under Light-Shielding Layers

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Solution Overview

Problem

The alignment mark on array substrates is easily shielded by light-shielding materials during the preparation of display panels, leading to positioning deviations and reduced yield due to the difficulty in determining the specific position of the alignment mark.

Innovation Solution

An array substrate design that includes a substrate, an alignment mark, a mark covering layer, and a light-shielding layer, where the mark covering layer has higher transmittance than the light-shielding layer and is in contact with it, allowing the alignment mark to be exposed and used for positioning during subsequent layer preparation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If a light-shielding layer is applied over the alignment mark to prevent light interference, then light shielding performance is improved, but the alignment mark becomes hidden and positioning accuracy deteriorates

Engineering Contradiction:
Improvelight interferenceVSAvoidpositioning accuracy
Core Design Contradiction:
Object-affected harmful factorsVSMeasurement precision

Solution Approach 1:

The light-shielding layer is segmented by creating a light-shielding hole that exposes the alignment mark, allowing the layer to simultaneously shield light in most areas while maintaining visibility of the alignment mark for positioning

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The alignment mark serves as an intermediary element that bridges the conflicting requirements of light shielding and positioning visibility, being selectively exposed through the light-shielding layer via the light-shielding hole

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If the alignment mark is fully exposed to maintain positioning visibility, then positioning accuracy is improved, but light interference increases causing preparation yield to deteriorate

Engineering Contradiction:
Improvepositioning accuracyVSAvoidpreparation yield
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The light-shielding layer is divided into a light-shielding portion and a light-shielding hole, creating a segmented structure that selectively blocks light while preserving alignment mark visibility for positioning

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The light-shielding layer exhibits different optical properties in different locations: it is opaque in the light-shielding portion to prevent light interference, and transparent/open in the light-shielding hole to allow alignment mark visibility

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design improves the accuracy of layer positioning and increases the preparation yield of display panels by ensuring the alignment mark remains visible despite the application of light-shielding layers, reducing the risk of alignment errors.

Implementation Method 1

A transmittance of the light-shielding layer is less than a transmittance of the mark covering layer

Methodology Applied
Scientific EffectLight transmittance: Light

Data Source

PatentUS20240038676A1Array substrate, preparation method thereof, display panel, and display device
Publication Date: 2024.02.01 TIANMA ADVANCED DISPLAY TECH INST (XIAMEN) CO LTD
  • US20240038676A1 patent drawing
  • US20240038676A1 patent drawing
  • US20240038676A1 patent drawing

AI summary

Provided are an array substrate, a preparation method thereof, a display panel, and a display device. The array substrate includes a substrate, an alignment mark, a mark covering layer, and a light-shielding layer. The alignment mark is disposed on a side of the substrate. The mark covering layer is disposed on a side of the alignment mark facing away from the substrate. The mark covering layer at least partially overlaps the alignment mark. The transmittance of the light-shielding layer is less than the transmittance of the mark covering layer. The light-shielding layer is in contact with the mark covering layer and exposes at least a portion of the mark covering layer.