Array Substrate Capacitance Measurement Structure
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Solution Overview
Problem
The capacitance of storage capacitors in liquid crystal display panels with integrated color filter layers is unstable due to temperature-dependent dielectric constants, making it challenging to meet manufacturing requirements.
Innovation Solution
A structure comprising a first and second conductive region, with measurement regions connected to them, is formed on the array substrate to measure capacitance, allowing for the calculation of capacitance values based on overlapping areas and dielectric constants, ensuring accurate capacitance determination for sub-pixel capacitors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If color filter layer is integrated into the array substrate, then positioning error is eliminated and resolution is improved, but capacitance stability deteriorates due to temperature-dependent dielectric constant changes
Solution Approach 1:
The patent divides the array substrate into multiple measurement regions, each containing test conductive regions and measurement electrodes. By segmenting the measurement process into multiple localized areas, the system can capture temperature-dependent capacitance variations across different regions and compensate for instability through comparative analysis.
Solution Approach 2:
The patent measures capacitance at multiple temperature points and uses the temperature coefficient of capacitance to compensate for temperature-induced variations. By changing the measurement parameters (temperature, frequency) and analyzing the relationships, the system can distinguish between temperature effects and actual capacitance changes, thereby improving reliability.
2Area of stationary object
If color filter layer is integrated into the array substrate, then aperture ratio is improved, but capacitance measurement accuracy deteriorates due to dielectric constant variability
Solution Approach 1:
The patent performs preliminary measurements at multiple temperature points before final capacitance determination. By conducting preliminary characterization of the temperature-dependent dielectric constant and storing this data, the system can later compensate for temperature effects during actual measurements, improving measurement accuracy despite the integrated color filter structure.
Solution Approach 2:
The patent implements a feedback mechanism where capacitance measurements from test regions are used to determine temperature coefficients, which then feed back into the measurement algorithm to compensate for temperature effects in subsequent measurements. This closed-loop approach continuously improves measurement precision.
3Ease of manufacture
If traditional alignment method is used between color filter substrate and array substrate, then manufacturing process is simpler, but positioning error occurs reducing resolution
Solution Approach 1:
The patent merges the color filter layer directly into the array substrate structure, eliminating the separate color filter substrate and alignment process. By combining these functions into a single integrated structure, the patent achieves both improved positioning accuracy (no alignment error) and maintains manufacturing feasibility through the integrated fabrication process.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method provides stable capacitance measurements, enabling quality assessment and performance analysis of liquid crystal display panels by determining capacitance values accurately, thus improving manufacturing processes.
Implementation Method 1
a capacitance of a storage capacitor that is formed by a storage electrode and a pixel electrode is not stable
Implementation Method 2
since the dielectric constant of the color filter layer would change with temperature
Data Source
AI summary
A structure and a method for obtaining capacitance in an array substrate are disclosed. The structure comprises a first conductive region, arranged in a same layer as a first conductive layer of said array substrate; a second conductive region, arranged in a same layer as a second conductive layer of said array substrate, wherein said second conductive region overlaps with said first conductive region partly or totally; a first measurement region, connected with said first conductive region; and a second measurement region, connected with said second conductive region. The capacitance of the corresponding capacitor of the sub pixel can be detected by the structure, thereby providing data basis for judging the performance and quality of the sub pixel and the liquid crystal display panel.