Array Substrate Capacitor Layout for Wider OLED Defect Detection

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Solution Overview

Problem

Conventional shorting bar solutions for detecting defects in top-emission OLED devices have limited detection capability due to restrictions on the area of the detection object.

Innovation Solution

The array substrate design includes sub-pixels with a first transistor, a second transistor, and a storage capacitor, where the drain electrode of the second transistor is connected to the second electrode plate of the storage capacitor, allowing for improved defect detection via the second electrode plate.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional shorting bar solution is used for defect detection, then the detection process can be performed after source-drain electrode layer completion, but the detection capability is limited due to restrictions on the area of the detection object

Engineering Contradiction:
Improvedefect detection capabilityVSAvoidarea of detection object
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The patent extends the detection capability from limited shorting bar areas to the entire pixel array by utilizing the second electrode plate that spans across multiple sub-pixels. This dimensional expansion allows detection signals to cover a much larger area, transforming the detection scope from localized to comprehensive across the display panel surface.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The second electrode plate of the storage capacitor serves dual functions: it acts as a capacitor electrode for circuit operation and simultaneously serves as a detection electrode for defect detection. This multi-functionality eliminates the need for separate detection structures and enables comprehensive area detection using existing capacitor components.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If the second electrode plate is used for defect detection, then the detection capability is improved, but the device structure becomes more complex

Engineering Contradiction:
Improvedefect detection capabilityVSAvoiddevice structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The second electrode plate performs both its original capacitive function and a new detection function. By making this existing component multi-functional, the patent avoids adding separate detection structures, thereby improving detection capability without proportionally increasing device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The detection function is merged with the storage capacitor structure. The second electrode plate is integrated into both the capacitor circuit and the detection signal path, combining two functions into a single structural element and reducing overall system complexity.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS20250040248A1Array substrate and display panel
Publication Date: 2025.01.30 SHENZHEN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD
  • US20250040248A1 patent drawing
  • US20250040248A1 patent drawing
  • US20250040248A1 patent drawing

AI summary

The present application provides an array substrate and a display panel, the array substrate includes an underlay substrate and sub-pixels arranged in an array on the underlay substrate. Each sub-pixel at least includes a first transistor, a second transistor, and a storage capacitor. A drain electrode of the first transistor is connected to a gate electrode of the second transistor and is connected to a first electrode plate of the storage capacitor. A drain electrode of the second transistor is connected to a second electrode plate of the storage capacitor. The second electrode plate is disposed opposite to the first electrode plate, and is located on a side of the first electrode plate away from underlay substrate. The present application connects the drain electrode of the second transistor to the second electrode plate of the storage capacitor to detect more defects of the array substrate.