Array Substrate Defect Detection via Opposite Polarity Signal Injection
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Solution Overview
Problem
During the manufacturing of display panels, defect connections in data lines can occur due to process defects or operational errors, making it difficult to detect and intercept such faults, which affects product quality.
Innovation Solution
An array substrate design that includes data signal input buses and detection lines with opposite polarities, along with switching devices, allows for simultaneous signal transmission to detect defect connections by generating heat at faulty points, enabling quick and accurate identification of defective data lines.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional manufacturing processes are used without additional detection structures, then the manufacturing process remains simple, but defect connections in data lines cannot be detected
Solution Approach 1:
The patent applies preliminary action by incorporating detection lines and switching devices into the array substrate structure during manufacturing, before actual product use. The detection lines are pre-positioned at both ends of data lines, and switching devices are integrated at pixel electrode connections, enabling defect detection capability to be built in advance without requiring post-manufacturing modifications.
Solution Approach 2:
The patent uses detection lines as intermediary structures that run parallel to and independently from the functional data lines. These detection lines serve as mediators that can be activated through switching devices to test data line connectivity without interfering with normal display operations. The intermediary detection infrastructure enables defect identification while maintaining the integrity of the primary data transmission paths.
2Reliability
If detection lines and switching devices are added to enable defect detection, then defect connection detection becomes possible, but the manufacturing process and device structure become more complex
Solution Approach 1:
The patent merges the detection function with the existing array substrate structure by integrating detection lines alongside functional data lines and incorporating switching devices at pixel electrode connection points. This combining approach allows defect detection capability to be embedded within the manufacturing process itself, rather than requiring separate detection equipment or post-processing steps, thereby maintaining manufacturing efficiency while enhancing product reliability.
3Measurement precision
If multiple switching devices are used to control detection signals, then precise defect localization is achieved, but the device complexity and manufacturing difficulty increase
Solution Approach 1:
The patent applies segmentation by dividing the array substrate into discrete pixel units, each with its own switching device for controlling detection signals. This segmentation allows individual pixel rows or columns to be tested independently, enabling precise localization of defects to specific data lines or pixel connections. The segmented approach with distributed switching devices provides granular control over detection signal routing, achieving high defect localization accuracy while maintaining manageable device complexity through systematic organization.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution allows for simple and convenient detection of defect connections in data lines, ensuring high product quality by accurately identifying and addressing faulty connections during the manufacturing process.
Implementation Method 1
applying a data signal to the plurality of data lines through the data signal input bus; applying a detection signal to the plurality of data lines through the detection line... generating heat at faulty points
Data Source
AI summary
The disclosure provides an array substrate, a display device, a detecting apparatus and a detecting method for detecting a defect connection of a data line. A data signal input bus of the array substrate of the present disclosure applies a data signal to each pixel unit, and a detection line is added on one side of the array substrate opposite to the data signal input bus, when the product is detected, the data signal input bus inputs the normal data signal, the detection line on the other side inputs a signal having a polarity contrary to that of the data signal. At a position of the data line existing defect connection, heat is generated and the data line is burnt at the position existing defect connection.