Array Substrate Segmented Distribution Units for Visual Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
In the manufacturing process of display panels, there is a need for an effective visual test (VT) to detect defects before integrating the IC chip, requiring a desirable detection circuit that efficiently connects and controls sub-pixels for accurate testing.
Innovation Solution
The array substrate includes sub-pixels, data lines, multiple-channel distribution units with switch elements, and test units, where switch elements and control lines are interconnected to enable efficient signal transmission and control for VT, reducing wiring complexity and allowing for uniform display panel testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional detection circuits are used for visual testing, then the circuit can perform basic testing functions, but the wiring complexity increases and vertical display unevenness (mura) occurs
Solution Approach 1:
The array substrate is divided into multiple pixel units, each containing sub-pixels with dedicated data lines. Multiple-channel distribution units are segmented to correspond with specific data line groups, allowing independent control and testing of different regions. This segmentation reduces overall wiring complexity while maintaining detection accuracy.
Solution Approach 2:
Multiple-channel distribution units act as intermediary components between the data lines and the display pixels. These distribution units include switch elements that can selectively connect different data lines to specific pixel units, enabling complex testing functions through controlled signal routing rather than direct complex wiring.
2Reliability
If more data lines and control connections are added to improve testing coverage, then detection capability improves, but the non-display area increases and bezel width increases
Solution Approach 1:
The multiple-channel distribution units serve multiple functions: they distribute data signals to different data line groups during normal operation and simultaneously serve as testing pathways during visual testing. This multi-functionality allows comprehensive testing coverage without adding separate dedicated testing wiring, thus avoiding increased bezel width.
Solution Approach 2:
The patent organizes data lines into groups that correspond to different multiple-channel distribution units, creating a hierarchical structure. This dimensional organization allows efficient signal distribution and testing pathways to be established in the logical domain rather than requiring additional physical wiring space in the spatial domain.
3Adaptability or versatility
If switch elements are distributed across the entire array substrate, then control flexibility improves, but manufacturing complexity and alignment precision requirements increase
Solution Approach 1:
Switch elements are segmented and grouped within specific multiple-channel distribution units that correspond to particular data line groups. This localized grouping reduces the overall alignment complexity compared to fully distributed switches, as each distribution unit can be manufactured and aligned as a modular block rather than individual switches across the entire substrate.
Data Source
AI summary
Array substrates, motherboards of array substrates, display panels and method for forming display panels are provided. The array substrate includes sub-pixels, data lines, multiple-channel distribution units, X first switch control lines, test units and N second switch control lines. The first output terminals of the X first switch elements of a same multiple distribution unit are connected to the X data lines of the same data line group. The first control terminals of the X first switch elements of each multiple-channel distribution unit are connected to the X first switch control lines. The second output terminals of the second switch elements in a same test unit are electrically connected to the first input end of the first switch elements in the same multiple-channel distribution unit. The second control terminals of the N second switch elements in each test unit are connected to the N second switch control lines.