Array Substrate Driving Circuit Detection for OLED Panels
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Solution Overview
Problem
The pixel driving circuit in OLED panels is prone to defects such as short circuits or open circuits, leading to abnormal functioning and increased costs due to reduced yield and finished product defects.
Innovation Solution
A detection method and device for the array substrate driving circuit that includes a pixel driving circuit with a storage capacitor and switching transistors, where specific voltage signals and gate signals are applied in stages to determine if the circuit is normal by measuring the voltage at the light emitting device and comparing it to a theoretical value, identifying abnormalities like short or open circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional detection methods are used for array substrate driving circuits, then the detection process is simple, but the detection precision is low and defects may be missed
Solution Approach 1:
The detection method is divided into multiple sequential stages: all-on stage, data voltage changing stage, supply voltage changing stage, gate signal changing stage, and measurement stage. Each stage performs a specific function in the detection process, breaking down the complex detection task into manageable segments that progressively isolate and measure different circuit parameters to achieve high-precision defect detection.
Solution Approach 2:
Before the actual voltage measurement, the method performs preliminary actions including applying gate-on signals to turn on switching transistors, changing data voltages to store test values in capacitors, and adjusting supply voltages to establish proper bias conditions. These preliminary steps prepare the circuit in a known state that enables accurate subsequent measurement of the light emitting device voltage.
2Adaptability or versatility
If multiple switching transistors and capacitors are used in the pixel driving circuit, then the circuit functionality is improved, but the reliability decreases due to more potential failure points
Solution Approach 1:
The detection method uses the existing circuit components (switching transistors T1-T3, capacitor Cst, and light emitting device) to perform self-detection. By applying controlled gate signals and voltage signals, the circuit elements are activated in specific sequences that allow them to function as both operational components and detection subjects, eliminating the need for external test equipment and enabling the circuit to verify its own integrity.
Solution Approach 2:
The method measures the voltage at the light emitting device electrode terminal and compares it against expected voltage ranges to determine circuit normality. This feedback mechanism provides information about the operational state of the driving circuit, allowing identification of defects such as short circuits or open circuits in the switching transistors or capacitor based on voltage deviations from normal operating conditions.
Data Source
AI summary
The present disclosure provides a detection method and a detection device for an array substrate driving circuit. In the detection method, in an all-on stage, a first supply voltage signal is input to a power terminal, a first data voltage signal is input to a data input terminal, a first sensing voltage signal is input to a sensing voltage terminal, a first gate-on signal is input to a first gate terminal, and a second gate-on signal is input to a second gate terminal. In a data voltage changing stage, the first data voltage signal is changed to a second data voltage signal. In a measurement stage, a voltage at a first electrode terminal of the light emitting device is measured, and the measured voltage is compared with a theoretical voltage to determine whether the array substrate driving circuit is normal.