Array Substrate Gate Line Segmentation for Defect Detection
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Solution Overview
Problem
In liquid crystal display (LCD) apparatuses, it is difficult to detect positions and causes of defects on the lower substrate where the gate driving part is formed, due to the complexity of inspecting the substrate effectively.
Innovation Solution
An array substrate with a pixel part, a driving circuit, and an inspection circuit is designed, where the inspection circuit is connected to the gate lines and can divide them into two groups for separate inspections, allowing for accurate detection of defects by applying different driving signals during different inspection times.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the gate driving part is formed on the lower substrate, then the LCD panel can be driven, but it becomes difficult to detect positions and causes of defects
Solution Approach 1:
The gate lines are divided into two groups (first gate lines and second gate lines) with different potentials applied to each group. This segmentation allows the inspection circuit to selectively inspect different regions of the pixel part, making defect detection possible even when the gate driving part is integrated on the lower substrate.
2Measurement precision
If the gate lines are inspected as a whole, then all gate lines can be checked, but the inspection efficiency is low and defect positions cannot be accurately identified
Solution Approach 1:
The gate lines are divided into two groups (first gate lines and second gate lines) with different potentials applied to each group. This segmentation allows the inspection circuit to selectively inspect different regions of the pixel part, making defect detection possible even when the gate driving part is integrated on the lower substrate.
Solution Approach 2:
The inspection is performed in multiple stages: first applying a first potential to first gate lines and second potential to second gate lines for initial inspection, then reversing the potentials for subsequent inspection. This periodic action enables systematic coverage of all gate lines while maintaining high inspection efficiency.
3Measurement precision
If different potentials are applied to different gate lines, then defect positions can be identified, but the inspection circuit complexity increases
Solution Approach 1:
The inspection circuit uses a unified approach to apply different potentials to different gate line groups through switching elements. The same inspection circuit structure handles both first and second gate lines by controlling the switching elements, reducing overall circuit complexity while maintaining the capability to apply different potentials.
Data Source
AI summary
In an array substrate and a display apparatus, a pixel part has a plurality of gate lines, a plurality of data lines, and a plurality of pixels electrically connected to the gate and data lines. A driving circuit drives the pixel part electrically connected to a first end of the gate lines. An inspection circuit is electrically connected to a second end of the gate lines, and inspects the pixel part in response to an inspection signal externally provided. Thus, positions and causes for defects of the pixel part may be accurately detected, thereby improving inspecting efficiency.