Array Substrate Testing for HG2D Drive Circuits
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing liquid crystal display (LCD) panel testing methods, which involve short-circuiting gate lines or data lines for cell testing, are inadequate for ensuring high-quality product yield and detecting dysfunctions effectively, particularly in HG2D drive circuits.
Innovation Solution
The proposed solution involves an array substrate with a display area and a peripheral area, featuring multiple pixel electrodes, gate lines, and data lines arranged in rows and columns, with specific shorting bars and conductive pads for interconnecting pixel electrodes, allowing for comprehensive testing of HG2D driving circuits, including red, green, and blue pixel electrodes, and the option to connect to common electrodes via additional shorting bars.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional shorting bar configuration is used for cell testing, then testing can be performed, but the testing coverage is insufficient for HG2D drive circuits and product yield cannot be effectively ensured
Solution Approach 1:
The patent divides the gate lines into odd columns and even columns, each connected to separate conductive pads (first and second conductive pads). This segmentation allows independent testing of different gate line groups, enabling comprehensive detection of dysfunctions in HG2D drive circuits and improving product yield through more effective quality control.
Solution Approach 2:
The patent creates different testing configurations for different regions of the pixel array. By connecting pixel electrodes of the same type (red, green, blue) to separate conductive pads through data lines, local quality variations can be detected in different color channels and regions, enhancing overall testing coverage.
2Adaptability or versatility
If HG2D drive circuit configuration is implemented, then display performance is improved, but traditional testing methods become inadequate for detecting circuit dysfunctions
Solution Approach 1:
The patent designs a universal testing structure with multiple conductive pads that can accommodate HG2D drive circuit configurations. The first and second conductive pads for gate lines, plus additional conductive pads for data lines, create a multi-functional testing interface that works with the HG2D architecture while enabling comprehensive dysfunction detection.
Solution Approach 2:
The patent introduces conductive pads as intermediary elements between the shorting bars and the pixel electrodes/gate lines/data lines. These conductive pads serve as mediation points that enable proper signal routing and testing for HG2D drive circuits, bridging the gap between traditional testing infrastructure and advanced circuit architectures.
Data Source
AI summary
The present invention provides an array substrate and a LCD panel. The array substrate, which comprises: a display area and a peripheral area, wherein the display area has at least two types of pixel electrodes, gate lines and data lines, which are arranged in rows and columns, one of the gate line is connected to two columns of the corresponding pixel electrodes and two of the data lines are connected to one row of the corresponding pixel electrodes. By the above description, the present invention can resolve requirements of testing HG2D (half-gate two-data line) drive circuit.