Array Substrate Insulating Layer Design for Capacitance and Transmittance

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Solution Overview

Problem

Conventional liquid crystal display (LCD) array substrates with silicon oxide as the dielectric layer of the storage capacitor are sensitive to static electricity and have limited capacitance due to thin gate-insulating layers, which also affect the transmittance and characteristics of thin-film transistors (TFTs).

Innovation Solution

The array substrate design incorporates a first insulating layer with high hydrogen content, made of silicon nitride, in the transistor and capacitor areas, and a second insulating layer with lower hydrogen content, made of silicon oxide, in the light transmittance area, to enhance capacitance and transmittance while preventing static electricity issues. This configuration includes a transparent electrode in the light transmittance area and uses a half-tone mask for precise patterning to exclude the insulating layer from the transmittance area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If a gate-insulating layer is used as the dielectric layer of the storage capacitor, then the capacitance of the storage capacitor can be increased by making the thickness small, but the structure becomes sensitive to static electricity

Engineering Contradiction:
ImprovecapacitanceVSAvoidstatic electricity sensitivity
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent uses a composite insulating layer structure combining silicon oxide and silicon nitride layers. The silicon oxide layer provides good interface characteristics with the semiconductor layer, while the silicon nitride layer provides high dielectric constant for increased capacitance and hydrogen content for passivating defects, thereby reducing static electricity sensitivity while maintaining high capacitance

Inventive Principle:
Principle #40Composite materials

2Quantity of substance

If silicon nitride is used as the insulating layer to increase capacitance, then the capacitance increases, but the light transmittance decreases

Engineering Contradiction:
ImprovecapacitanceVSAvoidlight transmittance
Core Design Contradiction:
Quantity of substanceVSIllumination intensity

Solution Approach 1:

The patent applies different insulating layer configurations to different regions of the substrate. In the light transmittance area, only a thin silicon oxide layer is formed to maintain high light transmittance. In the transistor and capacitor areas, a composite structure with silicon nitride layer is formed to provide high capacitance. This local differentiation resolves the contradiction between capacitance enhancement and light transmittance maintenance

Inventive Principle:
Principle #3Local quality

3Reliability

If a thick insulating layer is formed to prevent static electricity, then static electricity sensitivity is reduced, but the capacitance of the storage capacitor decreases

Engineering Contradiction:
Improvestatic electricity resistanceVSAvoidcapacitance
Core Design Contradiction:
ReliabilityVSQuantity of substance

Solution Approach 1:

The patent changes the dielectric constant parameter by introducing silicon nitride material with high dielectric constant (k≈7) into the insulating layer structure. This allows achieving the required capacitance value with a thinner physical layer thickness, thereby maintaining both high capacitance and static electricity resistance through optimized layer composition rather than simply increasing thickness

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution increases the capacitance of the capacitor and improves the characteristics of TFTs and light transmittance, while preventing static electricity issues and maintaining high transmittance by using silicon nitride as the dielectric layer and silicon oxide in the light transmittance area, respectively.

Implementation Method 1

hydrogen that is comprised in the first insulating layer may fill a defect site of the polysilicon and then may solve the defect site

Methodology Applied
Scientific EffectHydrogen diffusion: Diffusion

Implementation Method 2

the first insulating layer may include a material having a first light transmittance, and the second insulating layer may include a material having a second light transmittance that is different from the first light transmittance. The material of the first light transmittance, and the material of the second light transmittance may be silicon nitride and silicon oxide, respectively

Methodology Applied
Scientific EffectDielectric permittivity: Dielectric Permittivity

Data Source

PatentUS8598589B2Array substrate, method of manufacturing the array substrate, and display apparatus including the array substrate
Publication Date: 2013.12.03 SAMSUNG DISPLAY CO LTD
  • US8598589B2 patent drawing
  • US8598589B2 patent drawing
  • US8598589B2 patent drawing

AI summary

An array substrate is disclosed. In one embodiment, the substrate includes 1) a transistor area in which a transistor is formed, 2) a capacitor area in which a capacitor is formed, wherein the capacitor is electrically connected to the transistor and 3) a light transmittance area adjacent to at least one of the transistor area and the capacitor area. The substrate further includes 1) a first insulating layer formed in at least one of the transistor area and the capacitor area, wherein the first insulating layer is not formed in the light transmittance area and 2) a second insulating layer having i) a first portion arranged to substantially overlap with the first insulating layer in the at least one area, and ii) a second portion formed in the light transmittance area.