Array Substrate Line Detection Using Voltage Measurement
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Solution Overview
Problem
The existing line detecting methods for array substrates in TFT-LCD manufacturing are inefficient, requiring multiple technical processes and resulting in slower detection speeds and higher costs due to the need for line scanning and subsequent position detection using multiple sensors.
Innovation Solution
A line detecting apparatus and method that uses a voltage input terminal, input terminal sensor, equivalent resistor, and multiple output terminal sensors to directly determine the conduction condition of wires by measuring output voltages and comparing them to normal values, allowing for the direct identification of short-circuits and open-circuits without the need for additional scanning, thereby reducing the number of technical processes and detection time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple sensors (LDS, PDS, AOI) are used for line detection, then detection accuracy is improved, but device complexity and detection time increase
Solution Approach 1:
The patent combines the functions of LDS (line detection sensor), PDS (position detection sensor), and AOI (auto optical inspection) into a single integrated detection system. The detection apparatus includes a detection unit that can detect both the presence of defects and their positions simultaneously, eliminating the need for separate scanning processes and reducing hardware complexity while maintaining detection accuracy.
Solution Approach 2:
The detection unit is designed to perform multiple functions: detecting line defects (open/short circuits), determining their positions, and identifying their types. This multi-functional approach replaces the need for multiple specialized sensors and processes, simplifying the overall system while improving detection efficiency.
2Measurement precision
If multiple scanning processes (line scanning by LDS, position scanning by PDS/AOI) are performed, then detection accuracy is improved, but productivity decreases
Solution Approach 1:
The detection unit performs preliminary detection of line defects and their positions simultaneously in a single scanning process. By integrating position detection capabilities into the line detection process, the system eliminates the need for subsequent position scanning, thereby improving detection speed without sacrificing location precision.
Solution Approach 2:
The patent merges the line detection and position detection processes into a single integrated operation. The detection unit can identify both the presence of defects and their exact locations simultaneously, eliminating the sequential scanning processes required by traditional systems and significantly improving productivity.
3Measurement precision
If multiple detection processes are used, then detection accuracy is improved, but loss of time increases
Solution Approach 1:
The system performs preliminary and comprehensive detection in a single process, identifying both line defects and their positions simultaneously. This eliminates the need for multiple sequential detection processes, reducing detection time while maintaining high accuracy through the integrated detection unit's capability to perform multiple detection functions at once.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables the direct detection of short-circuit and open-circuit locations without requiring Position Detecting Sensors or Auto Optical Inspection, thereby reducing the technical processes, shortening detection time, and saving production costs.
Implementation Method 1
measuring an output voltage of the wire to be detected by the voltage detector
Data Source
AI summary
A line detecting apparatus and a line detecting method for an array substrate relates to the field of line detecting technology. The detecting method comprises: arranging an input terminal sensor (30) at a signal input terminal of a wire to be detected, arranging one output terminal sensor (41, 42, 43) at a signal output terminal of the wire to be detected, and arranging other output terminal sensor (41, 42, 43) at a signal output terminal of another wire adjacent to the wire to be detected; measuring an output voltage of the wire to be detected by a voltage detector; and determining the line conduction condition of the wire to be detected according to the output voltage as measured. When the sensors perform line scan, the coordinate of the specific location where the short-circuit or open-circuit occurs can be found directly without performing scan by PDS or AOI, thus simplifying the technical processes, shortening the time for detecting, and saving the production cost.