Array Substrate Notch Layout for Interference-Free Assembly
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Solution Overview
Problem
Interference between functional devices and array substrates during system assembly leads to deformation or failure, necessitating a solution to avoid such interactions.
Innovation Solution
The array substrate incorporates an avoidance notch at its edging, with a positioning structure that includes a main portion parallel to the notch's edge, and multiple layers such as conductive metal, insulating layers, and alignment marks, allowing for precise placement and reduction of interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If functional devices are placed close to array substrate during system assembly, then space utilization is improved, but interference between functional devices and array substrate occurs causing deformation or failure
Solution Approach 1:
The patent extracts the problematic region by creating an avoidance notch in the array substrate that removes the interfering portion of the substrate. This extraction eliminates the source of interference while preserving the functional device placement, thereby resolving the contradiction between space utilization and device reliability
Solution Approach 2:
The array substrate is segmented into functional regions and non-functional regions by introducing the avoidance notch. This segmentation allows different portions of the substrate to serve different purposes: maintaining structural integrity in most areas while creating a localized non-interference zone for functional device placement
2Reliability
If avoidance notch is added to array substrate, then interference between functional devices and array substrate is avoided, but device complexity increases
Solution Approach 1:
The avoidance notch introduces local quality change by creating a specific non-functional zone only where interference occurs. The rest of the substrate maintains its original uniform structure and properties, thereby minimizing the increase in overall device complexity while achieving the reliability improvement
3Manufacturing precision
If positioning structure with multiple layers is implemented, then alignment precision is improved, but manufacturing complexity increases
Solution Approach 1:
The positioning structure incorporates alignment marks and multi-layer configurations that perform preliminary alignment actions during manufacturing. These pre-built reference features enable precise positioning of functional devices before final assembly, thereby achieving high alignment precision while managing manufacturing complexity through systematic preparation
Data Source
AI summary
An array substrate is provided. The array substrate is provided with an avoidance opening at an edging thereof, an orthographic projection of the avoidance opening on a first reference plane having a first edge. The array substrate includes a substrate and at least one positioning structure. The at least one positioning structure is provided on a side of the substrate. A positioning structure includes a main portion, the main portion being substantially parallel to the first edge. The first reference plane is a plane where a surface, away from the positioning structure, of the substrate is located.