Array Substrate Probe Test Lines for LCD Testing
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Solution Overview
Problem
The high manufacturing costs and reduced productivity in liquid crystal display (LCD) device production are due to the increasing complexity of needle frames required for higher resolutions, which necessitate more contact portions for gate and data pads, leading to increased costs and decreased efficiency in the testing process.
Innovation Solution
The implementation of an array substrate with gate and data probe test lines in a non-display area, connected to gate and data lines through connection patterns, allows for efficient testing and inspection of liquid crystal cells, reducing the need for multiple needle frames and improving productivity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the number of contact portions for gate and data pads is increased to support higher resolutions, then the testing capability is improved, but the manufacturing cost and device complexity increase
Solution Approach 1:
The patent introduces probe test lines extending in the vertical direction (another dimension) from the gate and data lines, allowing testing contacts to be made at multiple positions along the line rather than requiring separate contact portions for each gate/data line. This dimensional extension enables a single needle frame to test multiple lines simultaneously.
Solution Approach 2:
The probe test lines serve multiple functions: they enable testing of multiple gate and data lines through a single contact portion, provide test signal transmission paths, and allow for both in-process and final product testing. This multi-functionality reduces the number of dedicated contact portions needed in the needle frame.
2Measurement precision
If more contact portions are added to the needle frame for higher resolution testing, then the testing coverage is improved, but the productivity decreases
Solution Approach 1:
The patent segments the gate lines and data lines into groups, with probe test lines extending from each group. This segmentation allows the needle frame to contact fewer, strategically positioned test lines that represent multiple gate and data lines, thereby maintaining testing coverage while reducing the number of contact portions needed.
Solution Approach 2:
The probe test lines act as intermediaries between the needle frame contact portions and the actual gate/data lines. Instead of the needle frame directly contacting each gate and data line, the probe test lines mediate the connection, allowing a single contact to test multiple lines through the extended probe structures.
3Measurement precision
If the needle frame structure is made more complex to accommodate higher resolutions, then the testing accuracy is improved, but the manufacturing cost increases
Solution Approach 1:
The probe test lines are formed as part of the array substrate manufacturing process itself, using the same thin film deposition and patterning techniques. This preliminary formation of test structures during normal production eliminates the need for separate, complex needle frame assemblies, thereby reducing manufacturing costs while maintaining testing accuracy.
Data Source
AI summary
A manufacturing method of an array substrate for a liquid crystal display device includes among other features, preparing a substrate including a display area and a non-display area, forming first and second gate shorting bars in the non-display area and electrically connected to gate lines, forming first and second data shorting bars in the non-display area and electrically connected to data lines, forming n gate probe test lines in the non-display area, forming m data probe test lines in the non-display area, forming first connection patterns connecting the gate lines and the n gate probe test lines, and forming second connection patterns connecting the data lines and the m data probe test lines, wherein the gate lines include n gate groups connected to the n gate probe test lines, respectively, and wherein the data lines include m data groups connected to the m data probe test lines, respectively.