Array Substrate Source Wire Breaking Part for Short Circuit Prevention
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Solution Overview
Problem
In the manufacturing of array substrates, residues or metal particles can cause short circuits between the scan line and data line during dark spot fixing operations, leading to cross curves and reduced product yield due to the proximity of the source wire to these lines.
Innovation Solution
The array substrate design includes a source wire with a predetermined breaking part, set at a specific distance from the scan line and common line, to prevent short circuits by ensuring adequate space when the breaking part is cut, thereby maintaining electrical isolation and improving yield.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the source wire is cut close to the data line to fix dark spots, then the electrical connection between source and data line is broken, but the scan line and data line may become short circuit
Solution Approach 1:
The source wire is pre-designed with a breaking part at a specific position that is predetermined to be cut during dark spot fixing operations. This preliminary positioning ensures that when the breaking part is cut, sufficient distance exists between the cut location and the scan line, preventing short circuits while enabling effective dark spot correction
Solution Approach 2:
The breaking part of the source wire serves as an intermediary element that is intentionally positioned between the data line and the scan line. By cutting this intermediary breaking part, the electrical connection is broken to fix dark spots while the spatial arrangement prevents harmful short circuits between adjacent lines
2Area of stationary object
If the source wire is positioned close to the scan line to reduce area, then the layout is more compact, but the scan line and data line form short circuit during fixing operation
Solution Approach 1:
The source wire layout is pre-designed with a breaking part positioned at an optimal location that balances compactness and safety. The breaking part is predetermined to be cut at a position that maintains sufficient distance from the scan line, ensuring electrical isolation is preserved even in compact layouts
Solution Approach 2:
The source wire is segmented into different sections, with the breaking part being a distinct segment that is intentionally positioned away from the scan line. This segmentation allows the source wire to be compact overall while ensuring the critical cutting zone maintains safe distance from adjacent lines
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design effectively prevents short circuits between the scan line, data line, and common line during the dark spot fixing operation, enhancing the display panel's performance and increasing product yield by maintaining electrical isolation and reducing cross curve issues.
Implementation Method 1
when a laser is used to cut the source wire
Data Source
AI summary
An array substrate and a display panel are provided. The array substrate includes a data line, a thin film transistor having a gate and a source, a source wire, and a scan line. The source wire includes a predetermined breaking part configured to be cut off to break an electrical connection between the source and the data line. The scan line and the predetermined breaking part have a first predetermined distance in-between, and the first predetermined distance is used to prevent the scan line and the data line from forming a short circuit when a fixing operation is being performed.