Array Substrate Test Circuit for Display Panel Defect Detection
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Solution Overview
Problem
The existing display panel testing methods are inadequate for ensuring high-quality performance, particularly in efficiently testing various performances and displaying complex test pictures, due to limitations in signal control and distribution within the array substrate.
Innovation Solution
The array substrate is designed with a test circuit comprising multiple stages of subcircuits and demultiplexers (demux) that allow for independent control of sub-pixels, enabling the display of complex test pictures and facilitating defect detection, with shared control lines and electrostatic discharge circuits to manage signal transmission and static electricity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a test circuit is arranged in the non-display area with multiple stages of subcircuits and demuxes to enable complex test picture display and sub-pixel control, then the testing capability and defect detection effectiveness are improved, but the device complexity and circuit structure become more complex
Solution Approach 1:
The test circuit is divided into multiple stages of subcircuits, where each subcircuit contains demuxes that can be independently controlled. This segmentation allows complex testing functions to be broken down into manageable modules, improving testing capability while organizing the complexity in a structured manner.
Solution Approach 2:
The test circuit is designed with multi-functional demuxes that can route test signals to different data lines (odd-row or even-row) based on control signals. This universal structure allows the same circuit to perform multiple testing functions, enhancing adaptability without proportionally increasing complexity.
2Measurement precision
If multiple demuxes and control lines are used to provide independent control of sub-pixels for displaying complex test pictures, then the measurement precision and defect detection are improved, but the energy consumption increases
Solution Approach 1:
The test circuit uses control signals to periodically switch between different testing modes (odd-row data line testing, even-row data line testing) through the demuxes. This periodic switching allows comprehensive testing to be performed in discrete time intervals, improving defect detection while managing energy consumption through time-multiplexed operation.
3Loss of energy
If control lines are shared among multiple test circuits to reduce energy consumption, then the energy efficiency is improved, but the signal control and distribution become more complex
Solution Approach 1:
Multiple test circuits share common control lines, merging the control signal paths to reduce redundant wiring and energy consumption. The demuxes in each test circuit respond to these shared control signals, allowing coordinated operation of multiple test circuits with reduced energy overhead.
4Reliability
If electrostatic discharge circuits are added to protect control lines from static electricity, then the reliability is improved, but the device complexity increases
Solution Approach 1:
Electrostatic discharge circuits are integrated into the control line paths to provide beforehand protection against static electricity damage. These protection circuits are positioned to intercept and dissipate static charges before they can reach sensitive components, ensuring reliability while adding minimal structural complexity.
Data Source
AI summary
Some embodiments of the present disclosure provide an array substrate, a display panel and a display device. The array substrate includes a test circuit located in a non-display area, wherein the test circuit includes at least one stage of subcircuit, and the subcircuit includes at least one demux; except the first stage of subcircuit, the input ends of the demuxes in the subcircuit are connected with corresponding output ends of the demuxes in the previous stage of subcircuit; except the last stage of subcircuit, the output ends of the demuxes in the subcircuit are connected with corresponding input ends of the demuxes in the next stage of subcircuit; and the input end of the demux in the first stage of subcircuit is connected with a test terminal, and the output ends of the demuxes in the last stage of subcircuit are connected with signal lines in a display area.