Array Substrate Test Line Segmentation for Electrostatic Protection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The manufacturing process of liquid crystal display panels often misjudges qualified products as defective due to defects in the shorting bar region, leading to reduced yield and waste, primarily caused by electrostatic breakdown and instability at the edges of the array substrate.
Innovation Solution
The array substrate design includes alternately disposed first and second data lines connected to test lines through switch elements, such as thin film transistors, which allows for testing without causing electrostatic issues, and the test lines are configured to be removable without affecting the display functionality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If a shorting bar region is arranged along the periphery of the liquid crystal display panel for testing, then the difficulty in testing pictures is reduced and testing equipment cost is reduced, but electrostatic breakdown occurs easily leading to misjudgment of qualified products as defective
Solution Approach 1:
The data lines are divided into first data lines and second data lines that are disposed alternately. The first data lines are directly connected to the first test line, while the second data lines are connected to the second test line through switch elements. This segmentation allows selective testing of different data line groups, reducing electrostatic accumulation and preventing misjudgment of qualified products.
2Ease of operation
If the shorting bar region is arranged at the edge of the array substrate for test convenience, then test access is improved, but process treatment stability deteriorates due to edge effects
Solution Approach 1:
Different connection configurations are applied to different regions: first data lines are directly connected to the first test line (simple connection), while second data lines are connected through switch elements (controlled connection). This local differentiation allows stable process treatment while maintaining test accessibility at the edge region.
3Reliability
If aluminum-containing material is used for test lines to improve conductivity, then electrical conductivity is improved, but electrostatic breakdown happens more easily at the edge
Solution Approach 1:
Switch elements are introduced as intermediary components between the second data lines and the second test line. These switch elements act as mediators that control the connection, allowing electrical testing while reducing direct electrostatic exposure of the aluminum-containing test lines at the vulnerable edge region.
Data Source
AI summary
An array substrate, a testing method and a manufacturing method of the array substrate are disclosed. The array substrate comprises a first test line (3), a second test line (4), and first data lines (1) and second data lines (2) that are disposed alternately. The first data lines (1) are directly connected to the first test line (3), and the second data lines (2) are connected to the second test line (4) through switch elements (7); or, the second data lines (2) are directly connected to the second test line (4), and the first data lines (1) are connected to the first test line (3) through switch elements (7). With the array substrate, charges in the display region can be avoided from being transferred to a test line, thereby decreasing the accumulation of static electricity, and enhancing reliability of the short bar region.