Array Substrate Test Line Segmentation for Display Panel Cutting
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Solution Overview
Problem
During the cutting process of large glass substrates into individual display panels, the overline structures of test circuits can cause short circuits due to the cutter wheel cutting through, leading to interference between different electrical signals.
Innovation Solution
The array substrate design includes a substrate body with display units, a cutting area, and test lines that are insulated from each other, with bending segments across the cutting line to prevent short circuits. The test lines are arranged such that they are insulated and include bending segments that break when cut, avoiding contact and interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If test lines are designed in a gap between display panels with overline structures, then testing can be performed on the large glass substrate, but the cutter wheel cutting through the overline structure causes short circuits between test circuits
Solution Approach 1:
The test lines are segmented into multiple parts: a first test line segment in the cutting area, a second test line segment in the display area, and an insulating layer between them. The cutting line is designed to cut through the insulating layer and separate the first test line segment from the second test line segment, preventing short circuits while maintaining testing capability.
Solution Approach 2:
An insulating layer is introduced as an intermediary between the first test line segment and the second test line segment. This insulating layer is positioned at the cutting area and is designed to be cut by the cutter wheel, effectively isolating the two test line segments and preventing electrical short circuits between them.
2Reliability
If test circuits are insulated from each other by an insulating layer, then mutual interference between signals is prevented, but the cutter wheel still causes short circuits by cutting through the overline structure
Solution Approach 1:
The insulating layer is selectively applied only in the cutting area where the cutting line intersects with test lines. In other areas, the test lines maintain their normal structure for optimal electrical performance. This localized approach provides insulation where needed without affecting the overall manufacturing process or signal quality.
3Productivity
If the cutter wheel cuts through the overline structure, then individual display panels can be separated, but short circuits occur between test circuits transmitting different signals
Solution Approach 1:
The test lines are pre-configured with segments and insulating layers in the cutting area before the cutting process. This preliminary arrangement ensures that when the cutter wheel cuts through, it separates the first test line segment from the second test line segment, and the insulating layer prevents electrical contact, thereby avoiding short circuits before they can occur.
Data Source
AI summary
Disclosed are an array substrate and a display panel formed by cutting the array substrate, the array substrate includes a substrate body, a first test line, a second test line, and a cutting line; the substrate body includes a plurality of display units and a cutting area located between the plurality of display units; the first test line and the second test line are disposed in the cutting area; the first test line is disposed across the second test line and insulated from each other; the first test line and/or the second test line includes a bending segment disposed across the cutting line.