Array Substrate Test Switch Isolation for OLED Panel Testing
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Solution Overview
Problem
Conventional OLED panels face issues where electrical signals in the cell test circuit are affected by the array test circuit, leading to decreased display performance and increased testing costs due to the need for probes at different intervals during production line tests.
Innovation Solution
An array substrate design featuring a fan-out region with first signal lines extending to an array test region, where array test pads are connected through test switches to dummy pads, allowing for isolation during cell tests by sending high or low-level signals to control the test switches, preventing interference from the array test circuit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If the array test circuit is used during cell testing, then the testing process can be simplified, but the electrical signal is affected leading to decreased display performance
Solution Approach 1:
The substrate is divided into distinct functional regions: array test region, cell test region, and fan-out region. The array test pads and cell test pads are spatially separated and independently controlled through test switches, allowing separate testing operations without mutual interference. This segmentation enables the array test circuit to be isolated during cell testing, resolving the contradiction between simplified testing and reliable display performance.
Solution Approach 2:
Test switches are introduced to dynamically control the electrical connection states of array test pads and cell test pads. During cell testing, the test switches electrically disconnect the array test pads from the first signal lines, while during array testing, the cell test pads are disconnected. This dynamic switching mechanism allows the system to adapt its configuration based on the testing mode, preventing signal interference and ensuring reliable display performance while maintaining testing flexibility.
2Adaptability or versatility
If probes at different intervals are arranged for testing, then both array testing and cell testing can be performed, but the testing setup becomes more complex and costly
Solution Approach 1:
The test pads are arranged in a unified grid pattern with consistent spacing across the array test region and cell test region. This universal spacing allows a single set of probes with fixed intervals to perform both array testing and cell testing functions. The test switches provide the adaptability to selectively connect different pads to different signal lines, enabling one probe configuration to serve multiple testing purposes, thereby reducing probe arrangement complexity while maintaining versatile testing capability.
3Productivity
If the array test pads are always connected to signal lines, then array testing can be performed, but cell testing is interfered with
Solution Approach 1:
Test switches are positioned between the array test pads and the first signal lines to dynamically control their electrical connection. During array testing, the test switches are activated to connect array test pads to signal lines, enabling efficient array testing. During cell testing, the test switches are deactivated to disconnect array test pads from signal lines, preventing interference with cell test accuracy. This dynamic control mechanism allows the system to switch between testing modes without compromising either array testing efficiency or cell test accuracy.
Data Source
AI summary
The present invention provides an array substrate and a display panel. The array substrate includes a fan-out region, an array test region having multiple array test pads and multiple test switches, and a cell test region having multiple cell test pads and a dummy pad. A control end of each test switch is connected to the dummy pad, and the array test pads are connected to the first signal lines through the test switches. According to a high-level signal or a low-level signal received by the dummy pad, the test switch is turned on or off to conduct an array test or a cell test.