Array Substrate Test Wiring Layout for Narrower Display Bezels

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Solution Overview

Problem

Current display devices have larger bottom bezels and unsatisfactory screen-to-body ratios due to the space occupied by traditional wire wound resistors in test circuits, which are used to prevent static electricity damage.

Innovation Solution

The array substrate design incorporates a first metal layer as a wire wound resistor, reducing the need for a separate second metal layer, with the second and third metal layers connected to the first, and features a layered structure with via holes to minimize space, allowing the second metal layer to only be electrically connected to the first, thereby reducing the bezel width and improving the screen-to-body ratio.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If wire wound resistors are introduced into test circuits to prevent static electricity damage, then reliability is improved, but device complexity and area increase resulting in larger bottom bezels

Engineering Contradiction:
Improveprotection against static electricity damageVSAvoidbottom bezel area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent combines the wire wound resistor structure with the existing second metal layer (gate electrode wiring) by making the second metal layer serve dual functions: as the gate electrode wiring and as the wire wound resistor. This merging eliminates the need for a separate resistor structure, thereby reducing the terminal region area and bottom bezel width while maintaining static electricity protection functionality.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The second metal layer is designed to perform multiple functions simultaneously: it acts as the gate electrode wiring for the TFT and as the wire wound resistor for static electricity protection. This multi-functionality reduces the overall number of components and minimizes the space required in the terminal region, directly addressing the contradiction between reliability and area.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Reliability

If traditional wire wound resistors are disposed above testing pads, then reliability is improved, but manufacturing precision requirements increase due to larger space occupation

Engineering Contradiction:
Improveprotection against static electricity damageVSAvoidaccuracy of test circuit wiring
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent merges the resistor function into the existing second metal layer routing, eliminating the need for separate resistor structures and their associated via holes. This integration simplifies the test circuit wiring structure and reduces the number of manufacturing steps, thereby lowering precision requirements while maintaining reliability.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS12009366B2Array substrate, manufacturing method thereof, and display device
Publication Date: 2024.06.11 WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
  • US12009366B2 patent drawing
  • US12009366B2 patent drawing
  • US12009366B2 patent drawing

AI summary

An array substrate, a manufacturing method thereof, and a display device are provided. The array substrate includes a terminal region. A testing electric circuit wiring is disposed in the terminal region. The testing electric circuit wiring includes a first metal layer, a second metal layer, and a third metal layer.