Array Substrate Testing Lines with Cut-off Points
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Solution Overview
Problem
Array substrates with complex structures, such as low temperature poly-silicon (LTPS) substrates, face damage from accumulated charges due to the antenna effect caused by elongate testing lines during production testing.
Innovation Solution
Incorporating cut-off points into testing lines with conductive contacts on the array substrate's surface, which are electrically connected to prevent charge accumulation and attenuate the antenna effect by segmenting the lines into shorter sub-lines.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If elongate testing lines are used to connect operating circuit interfaces and testing interfaces, then testing coverage is improved, but charge accumulation due to antenna effect increases causing circuit damage
Solution Approach 1:
The testing lines are divided into multiple shorter segments by introducing cut-off points at specific locations. Each segment is isolated from antenna effect accumulation, thereby maintaining testing coverage while preventing charge buildup that could damage operating circuits.
2Object-affected harmful factors
If testing lines are segmented into shorter sub-lines, then antenna effect is attenuated, but device complexity increases due to additional cut-off points and conductive contacts
Solution Approach 1:
The harmful antenna effect is extracted and isolated by removing continuity at strategic cut-off points. The conductive contacts are positioned to connect only at necessary locations, separating the harmful electromagnetic accumulation from the testing function while minimizing structural additions.
3Reliability
If conductive contacts are added at cut-off points, then electrical connectivity is maintained for testing, but manufacturing complexity increases
Solution Approach 1:
The conductive contacts and cut-off points are designed and positioned in advance during the substrate manufacturing process. This preliminary arrangement ensures that electrical connectivity is pre-established at critical locations while avoiding the need for complex post-manufacturing assembly steps.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Prevents damage to operating circuits by reducing the antenna effect, ensuring effective testing without charge accumulation on elongate testing lines.
Implementation Method 1
conductive contacts extending to an upper surface of the array substrate are arranged at two sides of each cut-off point of the testing line
Data Source
AI summary
The present disclosure provides an array substrate, its manufacturing method and a display device. The array substrate includes operating circuit interfaces, testing interfaces, and testing lines connecting the operating circuit interfaces and the testing interfaces. Each testing line includes at least one cut-off point, and conductive contacts extending to an upper surface of the array substrate are arranged at two sides of each cut-off point of the testing line. When testing an operating circuit, electrically connecting the conductive contacts at two sides of each cut-off point enables the testing line to be conductive.