Array Testing Device Voltage Distribution Noise Correction
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Solution Overview
Problem
Existing array testing methods face challenges in accurately detecting voltage distributions on array substrates due to noise caused by non-uniform distances between the modulator and the array substrate, leading to inaccuracies in measuring threshold voltages and voltage distributions.
Innovation Solution
An array testing device and method that includes a light source, modulator, polarizers, sensor, and image processor to detect and correct voltage distributions by resetting pixel voltages to a predetermined value, generating correction values, and applying them to measure threshold voltages, while accounting for noise from non-uniform distances.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If voltage distribution is detected using existing array testing methods, then measurement can be performed, but noise from non-uniform distances between modulator and array substrate reduces measurement precision
Solution Approach 1:
The patent applies preliminary action by performing a first array test to measure voltage distribution before the actual threshold voltage measurement. The measured voltage distribution is then used to generate correction values that compensate for noise from non-uniform distances. This preliminary measurement and correction value generation eliminates the harmful noise effect before the main measurement process.
Solution Approach 2:
The patent implements feedback by using the voltage distribution measurement results to generate correction values that are then applied to subsequent measurements. The system continuously refines the measurement by feeding back the detected voltage distribution information and using it to adjust and correct future measurements, thereby improving precision over time.
2Measurement precision
If threshold voltage measurement is performed without correction, then testing process is simple, but measurement accuracy is reduced due to noise
Solution Approach 1:
The patent performs preliminary actions including resetting pixel voltages to a predetermined value, conducting a first array test to measure voltage distribution, and generating correction values before performing the actual threshold voltage measurement. These preliminary steps establish a corrected baseline that improves measurement accuracy without significantly increasing overall process complexity.
Solution Approach 2:
The patent changes parameters by resetting pixel voltages to a predetermined value and applying correction values derived from voltage distribution measurements. These parameter changes enable more accurate threshold voltage measurements by compensating for noise effects while maintaining a manageable testing process.
3Reliability
If pixel voltages are reset to predetermined value, then noise correction becomes possible, but additional testing steps are required
Solution Approach 1:
The patent resets pixel voltages to a predetermined value as a preliminary action before conducting the first array test. This resetting enables subsequent voltage distribution measurement and correction value generation, improving testing reliability. The time investment in this preliminary step is offset by the elimination of noise-related measurement errors in subsequent tests.
Solution Approach 2:
The patent uses feedback by measuring voltage distribution after resetting pixel voltages, generating correction values from these measurements, and applying the correction values to improve subsequent measurements. This feedback loop enhances reliability by continuously refining measurements based on actual voltage distribution data.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution improves the precision of array testing by reducing noise and ensuring accurate detection of voltage distributions and threshold voltages, enhancing the reliability of array testing processes.
Implementation Method 1
a light source for providing light to an array substrate
Implementation Method 2
a modulator for modulating an optical characteristic of light having passed through the array substrate
Implementation Method 3
a sensor for receiving the light modulated by the modulator and generating image information on the array substrate
Implementation Method 4
an image processor for detecting a voltage distribution formed on the array substrate surface by analyzing the image information
Implementation Method 5
a first polarizer for polarizing light output by the light source in a first polarization direction and irradiating it to the array substrate
Implementation Method 6
a second polarizer for polarizing the light modulated by the modulator in a second polarization direction and irradiating it to the sensor
Data Source
AI summary
A method for testing an array, by using an array testing device for detecting a voltage distribution formed on an array substrate, includes resetting pixel voltages of a plurality of pixel circuits formed on the array substrate with a predetermined voltage, detecting the voltage distribution of the array substrate, generating a correction value for correcting the voltage distribution of the array substrate, and measuring a threshold voltage of a driving transistor included in the plurality of pixel circuits formed on the array substrate by applying the correction value.