Articulating Test Pin for Microcircuit Alignment
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Solution Overview
Problem
Current microcircuit test equipment faces challenges in making accurate, low-resistance, non-destructive electrical contact with closely spaced contacts, leading to incorrect connections, wear-induced debris contamination, and false defect identification, which increases costs and defects in both the equipment and microcircuits.
Innovation Solution
A multi-part articulating pin pair with an upper and lower leg joined by a hinge, biased by an elastomer, allows for axial alignment while maintaining robustness and reliability, enabling improved contact reliability and reduced wear, and can be retrofitted to existing load boards.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If traditional rigid test contacts are used to make electrical connection with microcircuit terminals, then structural simplicity is maintained, but alignment precision deteriorates leading to incorrect connections and false defect identification
Solution Approach 1:
The patent employs spring-loaded test contacts that are resilient rather than rigid, allowing dynamic adaptation to positioning variations. The spring mechanism enables the contacts to self-adjust and maintain precise electrical connection with microcircuit terminals despite minor misalignments, thereby improving alignment precision without requiring complex rigid positioning structures.
Solution Approach 2:
The patent modifies the mechanical parameters of the test contacts by introducing elasticity through spring mechanisms. This parameter change allows the contacts to deform and adapt to slight positioning variations, improving alignment precision while avoiding the need for complex rigid positioning systems.
2Productivity
If high-speed automated testing is performed to increase productivity, then testing speed is improved, but contact wear increases leading to debris contamination and false defect identification
Solution Approach 1:
The patent incorporates spring-loaded mechanisms that provide cushioning during contact establishment. The resilient springs absorb mechanical stress and reduce impact forces during high-speed testing operations, thereby minimizing wear on both the test contacts and microcircuit terminals. This beforehand cushioning prevents debris generation that would otherwise contaminate contacts and cause false defect indications.
Solution Approach 2:
By changing the mechanical properties of the contacts from rigid to resilient, the patent reduces contact wear during high-speed testing. The elastic deformation capability of spring-loaded contacts minimizes friction and abrasion, maintaining connection reliability even at high testing speeds.
3Reliability
If spring-loaded test pins are used to improve contact reliability, then connection reliability is improved, but structural complexity increases
Solution Approach 1:
The patent divides the test pin into separate functional segments: a resilient spring portion for reliable contact establishment and a simpler structural support portion. This segmentation allows the complex spring mechanism to be isolated to only where needed for contact reliability, while the rest of the structure remains simple and easy to manufacture.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enhances the reliability and frequency response of microcircuit testing by maintaining low contact resistance and reducing wear, thereby minimizing false defect identification and extending the lifespan of test equipment.
Implementation Method 1
an elastomer which engages both legs and biases the legs into contact
Data Source
AI summary
A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge (44/46) in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability.