ASER Apparatus Positioning Radiation Sources

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Solution Overview

Problem

Standard accelerated soft error rate (ASER) tests are sensitive to technician variability and pose a risk of radiation exposure, leading to unreliable and potentially harmful testing conditions for semiconductor devices.

Innovation Solution

A system and method for conducting ASER tests using an apparatus with adjustable components to control the Geometric Factor (GF) of radiation exposure, allowing precise positioning and orientation of radiation sources relative to semiconductor samples, and incorporating shielding to minimize operator exposure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If technicians manually position radiation sources during ASER tests, then the testing process is simple and quick to set up, but the test results show high variability and low reliability

Engineering Contradiction:

Improvetest result reliabilityVSAvoidapparatus complexity

Core Design Contradiction:

ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies parameter changes by precisely controlling the geometric factor (GF) - a parameter describing the spatial relationship between radiation source and semiconductor sample. By adjusting and standardizing GF values, the apparatus achieves consistent radiation exposure conditions, eliminating technician variability and improving test result reliability.

Inventive Principle:

Principle #35Parameter changes

Solution Approach 2:

The patent implements dynamics through adjustable mechanical components that allow precise positioning of the radiation source relative to the semiconductor sample. The apparatus can dynamically adjust the geometric configuration to achieve specific GF values, enabling both flexibility in testing different conditions and precision in reproducing standard conditions.

Inventive Principle:

Principle #15Dynamics

2Ease of operation

If technicians are exposed to radiation sources during testing, then direct manual positioning and adjustment is possible, but technicians face harmful radiation exposure

Engineering Contradiction:

Improvesource positioning easeVSAvoidradiation exposure to operator

Core Design Contradiction:

Ease of operationVSObject-affected harmful factors

Solution Approach 1:

The patent introduces an intermediary mechanical positioning system that acts as a mediator between the operator and the radiation source. The apparatus allows technicians to adjust and position radiation sources remotely or through automated mechanisms, eliminating direct manual handling of radioactive materials while maintaining ease of operation through user-friendly controls.

Inventive Principle:

Principle #24Intermediary (Mediator)

3Adaptability or versatility

If a fixed rigid apparatus is used for radiation positioning, then the structure is simple and stable, but it cannot accommodate various sizes and shapes of semiconductor samples

Engineering Contradiction:

Improvesample compatibilityVSAvoidapparatus structure

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent applies universality by designing an apparatus that can handle multiple types of semiconductor samples with different sizes and shapes. The system uses adjustable geometric factors and configurable positioning mechanisms that adapt to various sample geometries, allowing a single apparatus to perform diverse testing functions without requiring multiple specialized devices.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enhances the credibility and repeatability of ASER tests, reduces radiation exposure for technicians, and allows for the testing of various semiconductor samples and radiation sources, improving quality control and reliability of soft error rate assessments.

Implementation Method 1

a first component (110) for holding a radiation source (150), wherein the first component (110) is adapted to holding a radiation source (150) of a plurality of sizes and shapes

Methodology Applied

Scientific EffectRadioactive decay: Radioactive Decay

Data Source

PatentUS8106664B2System and method for conducting accelerated soft error rate testing

Publication Date: 2012.01.31 SEMICON MFG INT (SHANGHAI) CORP

AI summary

An apparatus for a user to conduct an accelerated soft error test (ASER) on a semiconductor sample is provided. The apparatus comprises a first component for holding the radiation source, where the radiation source may be either an alpha-particle or neutron-particle source. The apparatus comprises a second component for holding the semiconductor sample, where the semiconductor sample may be either a silicon wafer or semiconductor chip. The apparatus comprises a connecting assembly for placing the first component and the second component relative to each other at a plurality of positions that subject the semiconductor sample to a radiation stress from the radiation source at a plurality of stress efficiencies. Among the benefits provided are improved repeatability and credibility of ASER tests and reduced radiation exposures to operators of ASER tests.