ASIC Diagnostic Circuit Using Distributed Parameter Measurement
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Solution Overview
Problem
The increasing complexity of electronic circuits in automation technology, particularly in position-measuring devices like rotary encoders, requires more integrated functional modules, leading to additional circuit complexity and the need for self-diagnostic functions in ASICs, which further complicates the circuits.
Innovation Solution
A circuit arrangement with a diagnostic function is introduced, comprising a higher-level ASIC with a diagnostic unit and at least one lower-level ASIC with a parameter-measuring unit, interconnected via a data channel. The parameter-measuring unit determines functional parameters of the lower-level ASIC and transmits them to the diagnostic unit, which evaluates these parameters to establish the operational readiness of the electronic circuit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If self-diagnostic functions are implemented in ASICs, then operational readiness can be autonomously determined, but circuit complexity increases substantially
Solution Approach 1:
The diagnostic system is segmented into two distinct parts: a parameter-measuring unit integrated in the lower-level ASIC that collects functional parameters, and a diagnostic unit in the higher-level ASIC that evaluates these parameters. This segmentation allows the lower-level ASIC to remain relatively simple while delegating the complex evaluation logic to the higher-level ASIC, thus improving operational readiness determination without substantially increasing the complexity of individual ASIC components.
2Area of stationary object
If more functional modules are integrated into ASICs, then space requirements are minimized, but circuit complexity increases
Solution Approach 1:
The invention merges the diagnostic functionality into the existing hierarchical ASIC structure by integrating a parameter-measuring unit within the lower-level ASIC and utilizing the higher-level ASIC's diagnostic unit. This merging approach allows diagnostic capabilities to be incorporated without adding separate standalone diagnostic devices, thereby minimizing space requirements while managing circuit complexity through the existing hierarchical architecture.
3Extent of automation
If diagnostic functions are integrated within each ASIC, then autonomous determination is achieved, but additional circuit complexity is required
Solution Approach 1:
The lower-level ASIC performs self-service by integrating a parameter-measuring unit that automatically collects functional parameters from its own electronic circuit. This self-service capability allows the ASIC to autonomously monitor its own operational parameters without requiring external diagnostic equipment, achieving autonomous determination while keeping the additional circuitry minimal and focused solely on measurement functions.
Solution Approach 2:
The system implements feedback by transmitting the functional parameters measured by the lower-level ASIC's parameter-measuring unit to the higher-level ASIC's diagnostic unit via a data channel. The diagnostic unit evaluates these parameters and can trigger appropriate responses, creating a closed-loop feedback system that enables autonomous operational readiness determination without requiring complex hardwired diagnostic logic within each ASIC.
Data Source
AI summary
A circuit arrangement with a diagnostic function, in particular for use in position-measuring devices, includes a higher-level application-specific integrated circuit (ASIC) having a diagnostic unit and an electronic circuit configured to perform a first intended function, and at least one lower-level ASIC having a parameter-measuring unit and an electronic circuit a second intended function. The parameter-measuring unit and the diagnostic unit are interconnected via a data channel. The parameter-measuring unit is configured to determine a plurality of functional parameters of the electronic circuit of the lower-level ASIC, and to transmit the functional parameters via the data channel to the diagnostic unit. The diagnostic unit is configured to establish operational readiness of the electronic circuit of the at least one lower-level ASIC by evaluating the functional parameters.