Aspheric Lens Eccentricity Detection via Wavefront Sensing
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Solution Overview
Problem
Current methods for detecting aspheric lens eccentricity, whether contact or non-contact, fail to achieve both high measurement accuracy and efficiency, with existing non-contact methods being complex and operator-dependent, and contact methods being time-consuming and risky for lens damage.
Innovation Solution
An aspheric lens eccentricity detecting device based on wavefront technology that uses a non-contact method involving wavefront measurement and pupil imaging, eliminating the need for moving or rotating mechanisms, and includes optical fiber light sources, collimating lenses, imaging spectrometers, and wavefront sensors to process images and distortion information for accurate eccentricity measurement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If contact detection method (single-point probe scanning) is used, then measurement accuracy is improved, but measurement time increases and lens damage risk increases
Solution Approach 1:
The patent replaces the mechanical single-point probe scanning system with a non-contact optical measurement system. The wavefront sensor and imaging detector capture the entire lens surface information simultaneously through optical paths, eliminating the need for mechanical scanning while achieving high measurement accuracy and significantly reducing detection time.
Solution Approach 2:
The patent transitions from one-dimensional point-by-point scanning to two-dimensional parallel imaging measurement. By using wavefront sensors and imaging detectors that capture the entire aperture information simultaneously, the system achieves comprehensive surface data acquisition in a single measurement, dramatically improving efficiency.
2Productivity
If optical imaging method is used, then measurement efficiency is improved, but measurement accuracy decreases
Solution Approach 1:
The patent merges the advantages of both wavefront sensing and imaging techniques into a unified measurement system. The wavefront sensor provides accurate optical path difference information for precise optical axis determination, while the imaging detector simultaneously captures the reflected light distribution for verification and additional measurement dimensions, achieving both high accuracy and high efficiency.
3Measurement precision
If surface interference method is used, then measurement accuracy is improved, but device complexity and operator requirements increase
Solution Approach 1:
The patent replaces the complex interferometry optical path with a more straightforward wavefront sensing system. The wavefront sensor directly measures the optical path differences introduced by the lens surface without requiring the complex interference fringe analysis and splicing algorithms needed in traditional interferometry methods, reducing both device complexity and operator skill requirements.
4Measurement precision
If interferometry method is used, then measurement accuracy is improved, but measurement time increases for large apertures
Solution Approach 1:
The patent transitions from sequential one-dimensional scanning interferometry to two-dimensional parallel wavefront measurement. The wavefront sensor captures the complete wavefront information across the entire lens aperture simultaneously, eliminating the need for time-consuming regional scanning and splicing operations that plague large aperture interferometry measurements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables fast and accurate non-contact detection of aspheric lens eccentricity with high precision, reaching sub-nanometer order accuracy, is safe for the lens, and suitable for online detection, reducing detection time and complexity, making it suitable for various applications.
Implementation Method 1
an upper wavefront sensor acquires distortion information of the reflected light on the upper surface of the lens under detection, and processes the distortion information to obtain tilt information of the upper surface of the lens under detection
Implementation Method 2
an upper collimating objective lens, light emitted by the upper optical fiber light source is collimated by the upper collimating objective lens
Implementation Method 3
The optical imaging method mainly uses a focusing telescope structure to generate a spherical wave matching a lens surface, and a circle formed on an imaging camera by rotation of a point or crosshair image reflected from the lens surface
Data Source
AI summary
The present invention discloses an aspheric lens eccentricity detecting device based on wavefront technology and a detecting method thereof. The device comprises: an upper optical fiber light source, an upper collimating objective lens, an upper light source spectroscope, an upper beam-contracting front lens, an upper beam-contracting rear lens, an upper imaging detector, an upper imaging spectroscope, an upper wavefront sensor, a lens-under-detection clamping mechanism, a lower light source spectroscope, a lower beam-contracting front lens, a lower beam-contracting rear lens, a lower imaging spectroscope, a lower wavefront sensor, a lower imaging detector, a lower collimating objective lens and a lower optical fiber light source. The present invention achieves non-contact detection, with no risk of damaging the lens, and there is no moving part in the device, so the system reliability and stability are high; and in the present invention, various eccentricity errors in the effective aperture of the aspheric lens can be detected at a time, thereby avoiding errors caused by splicing detection, and also greatly reducing the detection time, thus being applicable to online detection on an assembly line.