Aspherical Surface Measurement Correction Using Master Work Piece Calibration

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current shape measurement devices, particularly those using pivot-type styluses, face challenges in achieving high precision for aspherical surfaces due to limitations in calibration methods, which result in significant shape errors when measuring industrial products like lenses with design values in the range of several dozen nanometers.

Innovation Solution

A measurement value correction method that involves preparing multiple work pieces from the same design data, using one as a master to obtain reference measurement values, calculating calibration data based on design data, and applying this calibration to correct target measurement values using a model expression fitted to the relationship between design and correction values.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If conventional calibration methods using ideal spherical surfaces and cylindrical surfaces are used, then the calibration process is simple, but the measurement precision for aspherical surfaces deteriorates significantly

Engineering Contradiction:
Improvecalibration process simplicityVSAvoidmeasurement precision for aspherical surfaces
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The invention changes the calibration approach by using multiple work pieces with different aspherical parameters (different design values) instead of conventional spherical/cylindrical references. This allows the calibration data to capture the specific arc motion characteristics of pivot-type styluses when measuring aspherical surfaces, thereby improving measurement precision for aspherical work pieces while maintaining practical calibration feasibility

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention creates calibration data by measuring multiple work pieces that replicate the aspherical geometry characteristics. These work pieces serve as copies of the measurement target geometry, allowing the system to learn correction factors specific to aspherical surfaces without requiring an ideal reference sphere, thus resolving the contradiction between calibration simplicity and measurement precision

Inventive Principle:
Principle #26Copying

2Measurement precision

If multiple work pieces from the same design data are used for calibration, then the calibration data becomes optimum for the measurement target, but the calibration process complexity increases

Engineering Contradiction:
Improvecalibration optimalityVSAvoidcalibration process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The invention makes the calibration system universal by using multiple work pieces with different design values that all share the same aspherical geometry type. The calibration data obtained from these diverse work pieces can be applied to measure any work piece with similar aspherical characteristics, achieving broad applicability without requiring separate calibration for each specific measurement target

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The invention performs preliminary calibration measurements on multiple work pieces before actual production measurements. By pre-establishing calibration data from multiple reference work pieces, the system prepares correction factors in advance that can be efficiently applied during subsequent measurements, reducing real-time computational complexity while maintaining high precision

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS9921059B2Measurement value correction method, computer-readable recording medium, and measurement device
Publication Date: 2018.03.20 MITUTOYO CORP
  • US9921059B2 patent drawing
  • US9921059B2 patent drawing
  • US9921059B2 patent drawing

AI summary

A measurement value correction method according to the present invention is a measurement value correction method for correcting a measurement value obtained by tracing a surface of a work piece with a stylus, and including a step of preparing a plurality of work pieces made from same design data, a step of adopting one of the work pieces as a master work piece and obtaining a reference measurement value with the stylus, a step of obtaining calibration data based on a difference between the reference measurement value and the design data, a step of adopting one of the plurality of work pieces other than the master work piece as a measurement target work piece and obtaining a target measurement value with the stylus, and a step of obtaining a corrected measurement value by correcting the target measurement value by using the calibration data.