Assay Device Diverter for Multiplexed Sample Metering
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Solution Overview
Problem
Current diagnostic analyzers face challenges in increasing throughput without adding complexity or accelerating component failure, as existing methods often require additional hardware and processes that complicate the systems and reduce reliability.
Innovation Solution
The assay device features a support with two or more test elements and a diverter that directs a single fluidic sample to multiple test elements, allowing for simultaneous testing without additional processes or actuations, thereby increasing throughput without increasing system complexity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If additional hardware (parallel processes, additional incubators, additional metering systems, or additional readers) is added to increase throughput, then productivity increases, but device complexity increases
Solution Approach 1:
The patent combines multiple test elements (at least two) onto a single assay device substrate, allowing multiple assays to be performed simultaneously on one device. This merging approach enables the system to process multiple samples without requiring separate incubators, metering systems, or readers for each, thereby increasing throughput while avoiding the complexity increase that would result from adding parallel hardware processes.
Solution Approach 2:
The assay device is designed as a multi-functional platform that can perform multiple different assays on a single device. The device includes multiple test elements that can conduct various types of testing (e.g., different analyte detections) simultaneously, making the single device universal enough to replace multiple specialized devices, thus improving productivity without increasing overall system complexity.
2Productivity
If additional hardware is added to increase throughput, then productivity increases, but reliability decreases due to accelerated component failure
Solution Approach 1:
By merging multiple test elements into a single assay device, the patent reduces the total number of hardware components (incubators, metering systems, readers) required in the system. Fewer components mean fewer potential failure points, thereby maintaining or improving reliability while still achieving increased throughput through the multi-element design.
3Productivity
If the physical size of the analyzer is expanded to accommodate additional processes, then productivity increases, but the analyzer occupies more space
Solution Approach 1:
The patent merges multiple assay functions into a single compact device footprint. By integrating at least two test elements on one substrate rather than requiring separate devices for each assay, the system achieves higher throughput without proportionally increasing the physical space occupied by the analyzer.
Solution Approach 2:
The patent utilizes the two-dimensional surface area of the assay device substrate more efficiently by arranging multiple test elements in different spatial zones on the same plane. This allows multiple assays to be conducted simultaneously within the same physical footprint, effectively increasing throughput without expanding the analyzer's occupied space.
Data Source
AI summary
An assay device includes a support, test elements arranged thereover, and a diverter defining a common sample addition area of the device. The diverter conducts respective portions of a fluidic sample from the area to each of the test elements. Another assay device includes the test elements, one a dry slide element, disposed over the support at least partly in proximity to each other to define a common sample addition area. Apparatus for analyzing a sample includes an assay device having the test elements, one a dry slide element. A controller operates a metering mechanism, to apply the sample to the assay device, an incubator, and a measurement device per a timing protocol to determine a characteristic of the sample. Methods for enabling an assay device to perform multiple tests based upon a single sample metering event include are also described.