Asymmetric Adhesion Regions for IC Package STIM Control
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Solution Overview
Problem
Conventional integrated circuit (IC) packages face challenges with heat management due to bleedout and voiding of solder thermal interface materials (STIMs), which compromise thermal performance and require large keep-out zones, limiting device density and reliability.
Innovation Solution
Incorporating asymmetric adhesion material regions on the lid of IC packages that guide the melted STIM towards specific areas, reducing bleedout and voiding, and enabling the use of STIMs instead of polymer-based thermal interface materials, thus enhancing thermal conductivity and package density.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If symmetric adhesion material regions are used on the lid, then the STIM distributes evenly during assembly, but the STIM experiences bleedout and voiding that compromise thermal performance
Solution Approach 1:
The patent applies asymmetry by configuring the adhesion material region on the lid with an asymmetric footprint relative to the die. The adhesion material extends beyond the die footprint on specific sides (first and second sides) but not on other sides (third and fourth sides), creating a non-uniform distribution pattern that prevents STIM bleedout and voiding while maintaining reliable thermal performance.
Solution Approach 2:
The patent implements local quality by providing different extension distances of the adhesion material beyond the die footprint on different sides. The adhesion material extends by a first distance on the first side and a second distance on the second side, where these distances differ, creating localized variations in adhesion strength that control STIM flow and distribution during the attachment process.
2Reliability
If large keep-out zones are used to prevent STIM bleedout, then thermal performance is maintained, but device density is reduced
Solution Approach 1:
The asymmetric adhesion material configuration eliminates the need for large symmetric keep-out zones by providing targeted adhesion control only where needed. The adhesion material extends beyond the die footprint selectively on specific sides, preventing STIM bleedout in those areas while allowing closer component placement on other sides, thereby increasing device density without compromising thermal performance.
3Ease of manufacture
If polymer-based thermal interface materials are used, then ease of manufacture is improved, but thermal conductivity is reduced
Solution Approach 1:
The patent changes the material parameter from polymer-based thermal interface material to solder thermal interface material (STIM). This material substitution significantly improves thermal conductivity while the asymmetric adhesion material configuration ensures the STIM remains controllable during assembly, preventing bleedout and voiding that would otherwise compromise manufacturing reliability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The asymmetric adhesion material regions effectively control STIM distribution, reducing keep-out zones and ensuring reliable thermal performance, allowing for more densely packed and thermally efficient IC packages.
Implementation Method 1
a solder thermal interface material (STIM) in contact with the first adhesion material region and the second adhesion material region
Implementation Method 2
the lid includes a second adhesion material region, asymmetric with respect to the die, in contact with the STIM
Data Source
AI summary
Disclosed herein are integrated circuit (IC) packages with asymmetric adhesion material regions, as well as related methods and devices. For example, in some embodiments, an IC package may include a solder thermal interface material (STIM) between a die of the IC package and a lid of the IC package. The lid of the IC package may include an adhesion material region, in contact with the STIM, that is asymmetric with respect to the die.


