Asymmetric Beam Bender for Charged Particle Deflection

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Solution Overview

Problem

Existing signal charged particle beam devices suffer from aberrations and distortion due to hexapole components in beam benders, leading to reduced focusing, angular resolution, and detection efficiency, especially when dealing with multiple beamlets and varying landing energies.

Innovation Solution

A signal charged particle deflection device with differently shaped electrodes and triangularly shaped apertures is introduced, which compensates for hexapole components, minimizing distortion and improving focusing and detection efficiency by providing a unique optical path for the signal charged particle beam.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If a conventional beam bender with symmetric electrodes is used to deflect the signal charged particle beam, then the beam can be redirected, but the beam becomes deformed and distorted due to hexapole components

Engineering Contradiction:
Improvebeam deflection capabilityVSAvoidbeam shape accuracy
Core Design Contradiction:
SpeedVSManufacturing precision

Solution Approach 1:

The patent applies asymmetry by configuring the first and second electrodes with different cross-sectional shapes. Specifically, when the beam is deflected horizontally, the electrodes have different vertical extensions; when deflected vertically, they have different horizontal extensions. This asymmetric configuration compensates for hexapole components and prevents beam deformation while maintaining deflection capability.

Inventive Principle:
Principle #4Asymmetry

2Productivity

If the width of the signal charged particle beam inside the beam bender is increased to improve throughput, then more beamlets can be processed, but the lateral position distortion of beamlets in the focus plane increases considerably

Engineering Contradiction:
Improvebeam throughputVSAvoidbeamlet position accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The asymmetric electrode configuration compensates for hexapole components that cause position distortion, enabling wider beams to be handled without significant loss of position accuracy. This allows multiple beamlets to be processed simultaneously with maintained precision.

Inventive Principle:
Principle #4Asymmetry

Solution Approach 2:

The patent changes the geometric parameters of the electrodes (different cross-sectional shapes and extensions) to optimize the electric field distribution. This parameter optimization reduces aberrations and maintains beamlet position accuracy even when beam width is increased for higher throughput.

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If energy filtering or angular filtering is applied to enhance contrast information, then topography and surface potential information can be improved, but the optical system complexity increases

Engineering Contradiction:
Improvecontrast information qualityVSAvoidoptical system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The asymmetric beam bender serves multiple functions: it deflects the beam, compensates for hexapole components, and works with energy/angular filtering systems. This multi-functional design enhances contrast information quality without proportionally increasing system complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution significantly reduces hexapole component effects, enhancing focusing, angular resolution, and detection efficiency while minimizing beam distortion, thus improving the overall performance of charged particle beam devices, particularly in electron beam inspection systems.

Implementation Method 1

the beam bender includes a first electrode and a second electrode providing an optical path for the signal charged particle beam therebetween

Methodology Applied
Scientific EffectElectric field: Electric Field

Data Source

PatentUS9805908B2Signal charged particle deflection device, signal charged particle detection system, charged particle beam device and method of detection of a signal charged particle beam
Publication Date: 2017.10.31 ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUER HALBLEITERPRUEFTECHNIK GMBH
  • US9805908B2 patent drawing
  • US9805908B2 patent drawing
  • US9805908B2 patent drawing

AI summary

A signal charged particle deflection device for a charged particle beam device is provided. The signal charged particle deflection device includes a beam bender configured for deflecting the signal charged particle beam, wherein the beam bender includes a first electrode and a second electrode providing an optical path for the signal charged particle beam therebetween, wherein the first electrode has a first cross section in a plane perpendicular to the optical path, and the second electrode has a second cross section in the plane perpendicular to the optical path, and wherein a first part of the first cross section and a second part of the second cross section provide the optical path therebetween, and wherein the first part and the second part are different in shape.