Asymmetrical I/O Structure for Voltage Withstanding and Speed

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Solution Overview

Problem

Current integrated circuit (IC) input/output (I/O) structures are symmetrical, leading to performance degradation and reliability issues as manufacturing processes advance, particularly in high-speed applications where operating voltages are lower than power supply voltages, and differences in NMOS and PMOS transistor characteristics affect service cycles.

Innovation Solution

An asymmetrical I/O structure is introduced, comprising a first power supply node connected to a higher voltage and a second power supply node connected to a lower voltage, with a pull-up unit and a pull-down unit connected between them, where the number of pull-up transistors differs from the number of pull-down transistors, allowing for optimized signal interaction through specific transistor configurations and voltage connections.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If stacked design is adopted to meet voltage withstanding requirements, then reliability is improved, but performance degradation occurs

Engineering Contradiction:
Improvevoltage withstandingVSAvoidperformance
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent applies asymmetry by using different numbers of transistors in the pull-up and pull-down paths. Specifically, when the operating voltage is lower than the power supply voltage, the pull-up path uses fewer transistors than the pull-down path, creating an asymmetrical structure that optimizes both reliability and performance for high-speed interfaces

Inventive Principle:
Principle #4Asymmetry

2Manufacturing precision

If separate manufacturing processes are used for NMOS and PMOS transistors, then manufacturing precision is improved, but reliability differences increase

Engineering Contradiction:
Improvetransistor fabricationVSAvoidservice cycle consistency
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent applies local quality by recognizing that NMOS and PMOS transistors have different manufacturing processes and reliability characteristics, and accordingly designs different path structures for pull-up and pull-down. The asymmetrical design allows each path to be optimized according to its specific transistor type and manufacturing characteristics

Inventive Principle:
Principle #3Local quality

3Device complexity

If symmetrical structure is used, then device complexity is reduced, but performance degradation occurs in advanced nodes

Engineering Contradiction:
ImproveI/O structureVSAvoidinterface speed
Core Design Contradiction:
Device complexityVSProductivity

Solution Approach 1:

The patent transitions from symmetrical to asymmetrical structure in advanced technology nodes. When the operating voltage is lower than the power supply voltage, the pull-up and pull-down paths use different numbers of transistors, creating an asymmetrical configuration that improves performance for high-speed interfaces while accepting increased complexity

Inventive Principle:
Principle #4Asymmetry

Data Source

PatentUS11855631B2Asymmetrical I/O structure
Publication Date: 2023.12.26 MONTAGE TECHNOLOGY CO LTD
  • US11855631B2 patent drawing
  • US11855631B2 patent drawing
  • US11855631B2 patent drawing

AI summary

An asymmetrical I/O structure is provided. In one embodiment, the asymmetrical I/O structure comprises a first power supply node connected to a first voltage, a second power supply node connected to a second voltage, a pull-up unit and a pull-down unit which are connected between the first power supply node and the second power supply node. The first voltage is higher than the second voltage. A node between the pull-up unit and the pull-down unit is connected to an I/O node. The pull-up unit comprises one or more pull-up transistors, and the pull-down unit comprises one or more pull-down transistors. The number of the pull-up transistors is different from the number of the pull-down transistors.