ATE Circuit Board PIN Diode Signal Integrity
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Solution Overview
Problem
Automatic test equipment (ATE) faces challenges in testing complex and high-performance integrated circuits due to the need for sophisticated test signals and the introduction of errors or degradations during testing, which can affect the yield of devices under test (DUTs) and require additional test steps to ensure calibration and quality control without modifying the circuit boards.
Innovation Solution
An electronic circuit board design incorporating a PIN diode connected in proximity to the circuit path, allowing for high-speed signal transmission with minimal parasitic effects, enabling the use of multiple test sources without mechanical relay switching and reducing impedance mismatch, and allowing for calibration and leakage testing without affecting the DUT testing procedure.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If additional interconnections are added to the circuit board for calibration and quality control, then measurement precision is improved, but device complexity increases and test time increases
Solution Approach 1:
The patent combines calibration functions and quality control functions with the main test circuit by integrating calibration signal generators and measurement equipment directly into the circuit board structure. This merging allows calibration and quality control to be performed without adding separate external interconnections, thus improving measurement precision while avoiding increased device complexity
Solution Approach 2:
The circuit board is designed with multi-functional capability, serving both as the test circuit for the device under test and as the calibration circuit. The same physical structure supports multiple functions including signal generation, calibration, quality control, and actual testing, eliminating the need for separate dedicated calibration interconnections
2Adaptability or versatility
If mechanical relay switching is used to connect multiple test sources, then adaptability is improved, but reliability decreases and device complexity increases
Solution Approach 1:
The patent replaces mechanical relay switching with solid-state electronic switching components. This substitution eliminates mechanical wear, contact resistance, and switching delays associated with relays, thereby improving reliability while maintaining the adaptability to connect multiple test sources through electronic control
3Productivity
If test interconnections are not removed from the circuit board, then productivity is improved, but measurement precision deteriorates due to impedance mismatch
Solution Approach 1:
The patent merges the test interconnections with the calibration interconnections by integrating them into a single unified circuit board structure. This allows both test and calibration signals to coexist without requiring physical removal or reconfiguration of interconnections, maintaining signal integrity through proper impedance matching while improving productivity
4Device complexity
If calibration is performed only once during manufacturing, then device complexity is reduced, but reliability decreases due to undetected errors
Solution Approach 1:
The patent implements continuous calibration capability that can be performed at any time during the test process, not just once during manufacturing. The calibration circuit remains active and can be repeatedly engaged to detect and correct drift or errors, ensuring continuous reliability while maintaining manageable complexity through automated calibration sequences
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables high-speed testing up to frequencies greater than 5 GHz with reduced signal distortion and increased reliability, minimizing test time and resource usage while maintaining the integrity of test signals and device performance.
Implementation Method 1
a PIN diode (Positive Intrinsic Negative diode) connected with a cathode or an anode to the circuit path
Data Source
Figure 1a~1c
Figure 2
Figure 3
AI summary
An electronic circuit board (CB) for automatic testing of an electronic device under test (DUT) with an automatic test equipment, ATE, including a first signal generator (SGl), the circuit board (CB) comprising: an ATE terminal (Tl). for coupling the ATE to the circuit board (CB), a device under test terminal (T2) for coupling a device under test (DUT) to the circuit board (CB), a circuit path (Wl) connecting the ATE terminal (Tl) with the device under test terminal (T2), and a PIN diode (D1) connected with a cathode (CA) or an anode (AN) to the circuit path (W1),. wherein the circuit board (CB) comprises a signal terminal (T3) which is connected to an anode (AN) or a cathode (CA) of the PIN diode (D1) and adapted to be coupled to a second signal generator (SG2), and the respective other side of the PIN diode (D1) is arranged in such a proximity to the circuit path (W1) that the length of an interconnection between the circuit path (W1) and the PIN diode (D1) is electrically short with respect to a signal frequency of a test signal of the ATE.