Automated Test Equipment Command-Based Resource Updates

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Solution Overview

Problem

Automated test equipment (ATE) faces challenges in efficiently updating tester resources during on-chip-system-tests (OCST) due to time-consuming conversion of software code into pattern sequences and limitations in download speed, especially with complex system-on-chip (SoC) devices, leading to untested transistors and incomplete functional performance checks.

Innovation Solution

The implementation of an automated test equipment that receives commands from a device under test or test case to update tester resources, providing acknowledge signaling for synchronization, allowing for standardized command evaluation and resource updates without specific adaptation of the ATE test program, using high-speed interfaces like USB, PCIe, or Ethernet for efficient communication.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If software code is converted into pattern sequences for OCST upload, then functional performance checks can be performed, but the conversion process is time-consuming and limits download speed

Engineering Contradiction:

Improvefunctional performance check coverageVSAvoidsoftware code conversion time

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The patent replaces the traditional mechanical/conversion-based approach of converting software code into pattern sequences with a direct digital communication approach using high-speed interfaces (USB, PCIe, Ethernet). This substitution eliminates the time-consuming conversion process while maintaining the ability to perform comprehensive functional performance checks through standardized command evaluation and resource updates.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

2Productivity

If digital channels are used for pattern-based OCST upload, then test patterns can be transmitted, but the download speed is limited by the maximum clock rate of digital channels

Engineering Contradiction:

Improvetest pattern transmission speedVSAvoiddownload speed limited by digital channel clock rate

Core Design Contradiction:

ProductivityVSSpeed

Solution Approach 1:

The patent introduces high-speed interfaces (USB, PCIe, Ethernet) as intermediary communication channels between the ATE and DUT, replacing the direct digital channel pattern transmission. These intermediary interfaces provide significantly higher bandwidth and faster download speeds while enabling standardized command evaluation and resource updates without being constrained by the maximum clock rate of traditional digital channels.

Inventive Principle:

Principle #24Intermediary (Mediator)

3Adaptability or versatility

If tester resources are updated during OCST execution, then test conditions can be dynamically adjusted, but synchronization between test case execution and resource updates becomes complex

Engineering Contradiction:

Improvedynamic test condition adjustmentVSAvoidsynchronization complexity

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent implements a feedback mechanism where the ATE provides standardized command evaluation and resource update confirmation to the DUT. This feedback loop enables dynamic adjustment of test conditions during OCST execution while maintaining synchronization through standardized protocols, reducing the complexity of coordinating between test case execution and resource updates.

Inventive Principle:

Principle #23Feedback

4Ease of manufacture

If legacy pattern-based approach is used for OCST upload, then existing ATE infrastructure can be utilized, but millions of transistors remain untested in complex SOCs

Engineering Contradiction:

ImproveATE infrastructure utilizationVSAvoidtransistor coverage

Core Design Contradiction:

Ease of manufactureVSReliability

Solution Approach 1:

The patent extends the ATE infrastructure to support multiple testing approaches: traditional pattern-based testing remains compatible while adding standardized command evaluation and resource update capabilities. This multi-functional approach enables comprehensive testing of complex SOCs, achieving high transistor coverage through functional performance checks while utilizing existing ATE infrastructure.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Data Source

PatentUS20240369617A1Automated test equipment, device under test, test setup methods using a measurement request

Publication Date: 2024.11.07 ADVANTEST CORP

AI summary

An automated test equipment for testing one or more devices under test is configured to receive, from a device under test, a command requesting a measurement of one or more physical quantities. The automated test equipment is configured to perform or initiate the measurement of the one or more physical quantities in response to the command provided by the device under test, and the automated test equipment is configured to provide a measurement result signaling to the device under test, to thereby signal a measurement result requested by the device under test. A device under test, methods and a computer program are also described.