ATE Resource Allocation via Distributed Processing Kernel
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Solution Overview
Problem
Conventional Automated Test Equipment (ATE) architectures are inefficient in utilizing resources for testing Integrated Circuits (ICs) with Designed for Test (DFT) structures, leading to lower resource utilization, increased costs, and inability to test certain devices concurrently due to dedicated resource allocation and sequential testing processes.
Innovation Solution
Implementing a dynamic allocation system where ATE resources are shared in a common pool, allowing resources to be assigned to testing blocks only when needed, and using a Distributed Processing Kernel to manage resource allocation and scheduling for optimal parallel testing of DFT blocks.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If ATE resources are dedicated to a testing block for the entire test session, then the testing block can be monitored and controlled continuously, but resource utilization decreases and test costs increase
Solution Approach 1:
The patent implements dynamic resource allocation where ATE resources are not permanently assigned to a testing block but are allocated on-demand based on actual testing needs. The system transitions from static dedicated allocation to dynamic shared allocation, allowing resources to be reassigned to different testing blocks as needed, thereby improving resource utilization while maintaining testing reliability through continuous monitoring capabilities.
Solution Approach 2:
The patent makes ATE resources universal by enabling them to serve multiple testing blocks sequentially and concurrently. Instead of dedicating specific ATE hardware, channels, and software resources to a single testing block, the system allows these resources to be shared across multiple testing blocks through a resource pool architecture, increasing overall resource utilization efficiency.
2Ease of operation
If ATE resources are allocated before test program execution, then resource assignment is simplified, but resource utilization efficiency decreases
Solution Approach 1:
The patent implements preliminary resource pool setup where ATE resources are prepared and made available in a common pool before test execution, but specific allocation to testing blocks is determined dynamically during test runtime based on actual needs. This approach maintains operational simplicity through pre-configured resource pools while achieving high utilization efficiency through on-demand allocation.
3Reliability
If testing blocks are tested sequentially with dedicated resources, then each block receives full attention, but test time increases and concurrency is limited
Solution Approach 1:
The patent segments the testing process into independent testing blocks that can be executed concurrently rather than sequentially. Each testing block is treated as an independent unit that can be allocated resources and executed in parallel with other blocks, reducing total test time while maintaining testing quality through independent verification of each block.
Solution Approach 2:
The patent enables continuous utilization of ATE resources by allowing multiple testing blocks to be executed concurrently rather than having resources idle between sequential tests. The system maintains continuous useful action by keeping resources engaged in multiple simultaneous testing operations, thereby reducing overall test time while preserving testing quality.
4Reliability
If ATE resources are constantly assigned to a testing block, then monitoring and control are maintained, but the ability to test multiple devices concurrently is reduced
Solution Approach 1:
The patent implements dynamic resource allocation that allows ATE resources to be assigned to multiple testing blocks concurrently based on actual monitoring and control needs. Rather than permanently assigning resources to a single block, the system dynamically adjusts resource allocation to maintain monitoring capability across multiple concurrent testing operations, thereby improving both reliability and concurrent testing capability.
Data Source
AI summary
An ATE system is described for testing one or more DFT testing blocks contained in one or more DUTs when coupled to the ATE system. The ATE system includes hardware resources and software processes under the control of a DPK (Distributed Processing Kernel). The DPK couples the hardware resources and software processes as needed for a first DFT testing block to be enabled for testing only when such resources and processes are available and locked for the first DFT testing block. The DPK is coupled to the first DFT testing blocks via data channels and control channels that are selected as needed for having the first DFT testing block enabled for testing. The channels are under the control of an DUTs-ATE interface which is directed by the DPK for connecting the first DFT testing block to the locked hardware resource and the locked software processes. Each set up process corresponding to any subsequent DFT testing block requesting any hardware resource and any software processes that are already locked for use is paused until such locked resource and locked software processes are unlocked and assigned for having that subsequent DFT testing block enabled for testing.