Universal ATE Interface Board for Multi-Protocol DUT Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional automated test equipment (ATE) systems are limited in their ability to test devices under test (DUTs) supporting different standards without hardware changes, as they require specific hardware bus adapter cards for each protocol, and the processing load and bandwidth constraints restrict the number of DUTs that can be tested simultaneously.
Innovation Solution
The ATE system incorporates a system controller, tester processor, and FPGA, where the FPGA generates commands and data internally, routing signals based on the DUT type, and a connector module with circuitry to route signals to the appropriate pins, allowing DUTs with different interface standards like U.2 and U.3 to connect to the same socket without hardware changes, and the FPGA can be reprogrammed to support various protocols.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If hardware bus adapter cards specific to each protocol are used, then protocol-specific testing capability is improved, but device complexity and hardware reconfiguration requirements increase
Solution Approach 1:
The patent implements a universal device interface board with a single socket that can accommodate multiple device types (U.2, U.3, E1.S, E3.S) without hardware changes. The system achieves protocol-specific testing capability through software configuration and pinout mapping rather than dedicated hardware adapters, making the testing equipment multi-functional and adaptable to different protocols and device form factors.
Solution Approach 2:
The system changes the electrical connection parameters dynamically through pinout mapping configurations. Different pinout mappings are applied based on the device type being tested, allowing the same physical socket to accommodate different device standards by reconfiguring which pins connect to which test channels, thus adapting the hardware behavior through parameter changes rather than physical hardware changes.
2Ease of operation
If the tester processor generates all commands and test patterns, then control flexibility is improved, but processing load and bandwidth requirements increase
Solution Approach 1:
The patent segments the command and test pattern generation functionality from the main tester processor and implements it in dedicated hardware logic within the device interface board. This segmentation allows the tester processor to focus on high-level test control and sequencing while the hardware logic handles low-level command generation and signal timing, thereby reducing the processing load and bandwidth requirements on the tester processor while maintaining control flexibility.
3Adaptability or versatility
If multiple device types are supported with different sockets, then device compatibility is improved, but ease of operation deteriorates due to hardware changes required
Solution Approach 1:
The patent implements a universal device interface board with a single socket design that can physically accommodate multiple device types (U.2, U.3, E1.S, E3.S) without requiring hardware changes. The system achieves device compatibility through software-based pinout mapping that dynamically configures the electrical connections based on the inserted device type, thereby maintaining both versatility and ease of operation.
Solution Approach 2:
The system uses pinout mapping configurations that essentially create virtual copies of different device interfaces through software. Instead of requiring physical hardware copies or adapters for each device type, the system replicates the electrical connection behavior of different device standards through configurable pinout mappings, allowing any device type to be tested on the same hardware platform.
4Adaptability or versatility
If pinout mappings are reconfigurable, then adaptability to different device standards is improved, but device complexity increases
Solution Approach 1:
The system implements automatic device detection and self-configuration capabilities. When a device is inserted into the socket, the system automatically detects the device type and configures the appropriate pinout mapping without requiring manual intervention or complex configuration procedures. This self-service approach reduces the perceived complexity for the user while maintaining high adaptability to different device standards.
Solution Approach 2:
The patent implements pre-configured pinout mapping profiles for different device types (U.2, U.3, E1.S, E3.S). These configurations are prepared in advance and stored in the system, allowing for rapid switching between device standards by simply selecting the appropriate pre-configured profile. This preliminary preparation of configuration options reduces the complexity of real-time configuration while maintaining versatility.
Data Source
AI summary
An automated test equipment (ATE) apparatus comprising a tester processor operable to generate commands and data for coordinating testing of a plurality of devices under test (DUTs). The ATE further comprises a field programmable gate array (FPGA) communicatively coupled to the tester processor, wherein the FPGA comprises routing logic operable to route signals associated with the commands and data in the FPGA based on a type of the device under test (DUT). Further, the ATE comprises a connector module communicatively coupled to the FPGA comprising a socket to which the DUT connects and further comprising circuitry for routing the signals to a set of pins on the DUT, wherein the set of pins are associated with a first type of DUT. The circuitry can support multiple different DUT types having a common form factor but different pinout assignments.