ATE Loopback Signal Path for RF Device Self-Testing
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Solution Overview
Problem
Existing automated test equipment (ATE) lacks efficiency in utilizing available resources for testing integrated radio frequency (RF) devices, particularly in performing bi-directional tests and utilizing the internal self-test resources of the device under test (DUT).
Innovation Solution
The proposed ATE includes a stimulus module, a measurement module, a loopback, and switches to form a loopback signal path between RF ports, enabling DUT self-testing and bi-directional operation without requiring an external loopback or modifications to the load board.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If traditional ATE configuration is used with independent RF pins connected to individual ports, then transmitter and receiver can be tested independently, but resource utilization efficiency is low and external loopback is required
Solution Approach 1:
The patent combines the transmitter and receiver test paths by integrating a loopback circuit within the ATE. This allows the transmitter output to be looped back to the receiver input through internal switching, eliminating the need for external loopback equipment and enabling more efficient resource utilization of the ATE components.
Solution Approach 2:
The ATE is designed with bi-directional ports that can function both as transmit ports and receive ports depending on the switching configuration. This multi-functionality allows the same hardware resources to be used for both transmitter and receiver testing, improving resource utilization efficiency.
2Adaptability or versatility
If bi-directional ports are implemented with additional switches, then port versatility is improved, but device complexity increases
Solution Approach 1:
The patent implements dynamic switching configurations where the ports can change their function between transmit and receive modes based on test requirements. The switches are controlled dynamically to reconfigure the signal paths, allowing the same physical ports to serve multiple functions without permanent hardware modifications.
3Productivity
If DUT internal resources are utilized for self-testing, then external resource requirements are reduced, but switching control complexity increases
Solution Approach 1:
The patent enables the DUT to perform self-testing by utilizing its own internal transmitter and receiver resources. The loopback circuit allows the DUT's transmitter to send signals that are received by its own receiver, eliminating the need for external test equipment for certain test functions and reducing overall resource requirements.
Data Source
AI summary
An embodiment is an automated test equipment (ATE) for testing a device under test (DUT) which is connected to the ATE via a load board. The ATE includes a stimulus module, a measurement module, a loopback, a first switch, a second switch, and a load board interface. The load board interface includes a first radio frequency port and a second radio frequency port. The first and second radio frequency ports are configured to be coupled to the respective ports of the load board. The first switch is configured to couple the first radio frequency port to the stimulus module in a first switching state of the first switch and the second switch is configured to couple the second radio frequency port to the measurement module in a first switching state of the second switch. Further, the first switch is configured to couple the first radio frequency port to a first end of the loopback in a second switching state of the first switch and the second switch is configured to couple the second radio frequency port to a second end of the loopback in a second switching state of the second switch. When the first and second switches are in their respective second switching state, a loopback signal path is formed between the first and second radio frequency ports.