ATE Probe Alignment Device with Coarse and Fine Segmented Guidance
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Solution Overview
Problem
Automatic test equipment (ATE) faces challenges in accurately and gently aligning and connecting to devices with irregular surfaces, often causing damage to the electrical leads during the testing process.
Innovation Solution
The proposed solution involves a probe alignment system with a combination of coarse and fine alignment features, including chamfered surfaces and movable components, which guide the target device into electrical contact without bending the leads, using an outer shroud and inner structure with springs to facilitate movement and precise alignment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a probe is used to connect to devices with irregular surfaces, then electrical connection is achieved, but the electrical leads may be damaged or bent during alignment
Solution Approach 1:
The alignment system is divided into two distinct segments: a coarse alignment feature (external to the probe) that performs initial positioning, and a fine alignment feature (internal to the probe) that performs precise positioning. This segmentation allows the harmful alignment forces to be distributed across two stages, with the fine alignment feature completing the precise positioning without requiring excessive force that would damage the leads.
Solution Approach 2:
The fine alignment feature acts as an intermediary between the coarse alignment feature and the electrical contacts. It receives the target device from the coarse alignment feature and guides it into precise alignment with the electrical contacts, absorbing the alignment forces and preventing direct transmission of harmful forces to the electrical leads during the critical connection phase.
2Measurement precision
If conventional alignment methods are used, then alignment is achieved, but the alignment precision is insufficient for accurate electrical connection
Solution Approach 1:
The alignment system is divided into two distinct segments: a coarse alignment feature (external to the probe) that performs initial positioning, and a fine alignment feature (internal to the probe) that performs precise positioning. This segmentation allows each feature to be optimized for its specific function, achieving high overall alignment precision without excessive complexity in any single component.
Solution Approach 2:
The fine alignment feature is positioned locally within the probe interior, close to the electrical contacts, where it provides concentrated precision alignment exactly where needed. The coarse alignment feature handles the broader positioning requirements externally. This local placement of the fine alignment feature maximizes alignment precision at the critical connection point without requiring the entire probe structure to be complex.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables reliable and damage-free electrical connections to devices with irregular surfaces, ensuring accurate testing without inflicting substantial damage on the target device's leads, and is adaptable for various types of devices, including solid state drives.
Implementation Method 1
The inner structure may comprise one or more springs between the inner structure and the outer shroud to enable the outer shroud to move relative to the inner structure. The inner structure may comprise one or more springs between the outer shroud and the probe card to enable the outer shroud to move relative to the probe card.
Data Source
AI summary
A probe for automatic test equipment (ATE) includes: an outer shroud including a course alignment feature configured to receive a target device and to guide the target device into an interior of the outer shroud, where the target device includes exposed electrical leads; and an inner structure that is at least partly inside the outer shroud. The inner structure includes electrical contacts for making an electrical connection to the exposed electrical leads, and also includes a fine alignment feature configured to guide the target device towards the electrical contacts to make the electrical connection.