Single-Socket ATE Relay Switching for DC and Dynamic Tests
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Solution Overview
Problem
Existing automated test equipment (ATE) requires transferring devices under test (DUT) between sockets for performing DC and dynamic tests, which increases testing time.
Innovation Solution
An ATE with two relay barriers that allow a DUT to be alternatively connected to circuitry for performing dynamic tests or DC tests on the same DUT without transferring between sockets, using a first relay barrier for dynamic tests and a second relay barrier for DC tests.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If DUT is transferred between sockets for different test types, then DC tests and dynamic tests can be performed separately, but testing time increases
Solution Approach 1:
The patent combines DC test circuitry and dynamic test circuitry into a single socket interface by using relay barriers to switch between different test modes. This allows both DC and dynamic tests to be performed on the same DUT without physical transfer, resolving the contradiction between test accuracy and testing time.
Solution Approach 2:
The patent uses relay barriers that can dynamically switch between connecting to DC test circuitry or dynamic test circuitry based on the test type required. This dynamic switching capability enables the system to adapt to different test requirements while maintaining a single socket connection, eliminating transfer time.
2Reliability
If separate sockets are used for DC tests and dynamic tests, then each test type has dedicated circuitry, but device complexity increases
Solution Approach 1:
The patent makes a single socket universal by incorporating relay barriers that can switch between DC test mode and dynamic test mode. The same physical socket and DUT connection can serve multiple test functions, reducing the need for separate dedicated sockets while maintaining test integrity.
Solution Approach 2:
The relay barriers act as intermediary switching elements between the single socket interface and the separate DC/dynamic test circuitry. This intermediary mechanism allows the system to maintain dedicated test paths while using a unified socket interface, reducing complexity without sacrificing test dedicatedness.
3Productivity
If relay barriers are added to switch between test modes, then single socket operation is enabled, but device complexity increases
Solution Approach 1:
The patent segments the test circuitry into distinct DC test paths and dynamic test paths, with relay barriers controlling access to each path. This segmentation allows independent optimization of each test type while using a single socket, improving productivity without excessive complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables simultaneous performance of DC and dynamic tests on the same DUT, reducing testing time and improving efficiency with low cost and high reliability.
Implementation Method 1
a first relay barrier interposed between the hardware of the first portion and the DUT; a second relay barrier interposed between the hardware of the second portion and the DUT
Data Source
AI summary
Automated test equipment comprising: a housing for a device under test; a first hardware portion arranged to perform dynamic tests, in particular alternating current dynamic tests, on the device under test; a second hardware portion arranged to perform direct current tests on the device under test; a first relay barrier interposed between the hardware of the first portion and the device under test; a second relay barrier interposed between the hardware of the second portion and the device under test; wherein the first relay barrier and the second relay barrier can be alternatively switched to allow performing dynamic tests via the first hardware portion or direct current tests via the second hardware portion.