ATE Software Layers for Arbitrary SSD Sector Sizes
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Solution Overview
Problem
Conventional automated test equipment (ATE) systems are limited in their ability to test solid state drives (SSDs) with odd sector sizes, as they do not support arbitrary sector sizes and require hardware changes for different communication protocols, leading to inefficiencies and restricted testing capabilities.
Innovation Solution
An ATE system with a software-focused architecture that includes a system controller and a tester processor, where software layers manage data flow and protocol flexibility, allowing for testing of SSDs with arbitrary sector sizes and multiple protocols without hardware changes, by utilizing FPGAs to distribute command generation and protocol handling.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If conventional ATE systems use fixed hardware architecture for testing, then hardware stability is maintained, but the ability to support arbitrary sector sizes and multiple protocols is limited
Solution Approach 1:
The patent replaces fixed hardware configurations with software-based solutions. A software layer is introduced between the hardware and the testing logic, allowing the system to handle arbitrary sector sizes and multiple protocols through software configuration rather than hardware changes. This substitution enables the ATE system to adapt to different testing requirements without modifying the physical hardware architecture.
Solution Approach 2:
The patent creates a universal testing platform that can handle multiple protocols and sector sizes through a single hardware architecture. By introducing a software abstraction layer, the system achieves multi-functionality where one hardware platform can test various device types with different protocols and sector sizes, eliminating the need for dedicated hardware for each testing scenario.
2Adaptability or versatility
If hardware changes are made to support different protocols, then protocol compatibility is improved, but testing efficiency and throughput are reduced
Solution Approach 1:
The patent eliminates the need for physical hardware changes by replacing them with software-based protocol handling. The software layer interprets and manages different protocols, allowing the system to switch between protocols through software configuration rather than hardware reconfiguration, thus maintaining high testing throughput while achieving protocol compatibility.
Solution Approach 2:
The patent introduces dynamic adaptability to the ATE system through software configuration. The system can dynamically adjust its behavior to match different protocols and sector sizes without requiring physical reconfiguration. This dynamic software-based adaptation allows the system to maintain optimal testing performance across different device types.
3Adaptability or versatility
If software layers are added to manage data flow for arbitrary sector sizes, then support for odd sector sizes is improved, but processing overhead increases
Solution Approach 1:
The patent extracts the complexity of handling arbitrary sector sizes from the core testing logic by introducing a dedicated software layer. This layer specifically manages the data flow and sector size calculations, isolating the computational overhead to a specialized module rather than affecting the entire system. This extraction allows the main testing functions to operate efficiently while the software layer handles the complexity of odd sector sizes.
Data Source
AI summary
An automated test equipment (ATE) system comprises a computer system comprising a system controller, wherein the system controller is communicatively coupled to a tester processor, wherein the system controller is operable to transmit instructions to the tester processor. The tester processor is operable to generate commands and data from the instructions for coordinating testing of a device under test (DUT), wherein the DUT supports an arbitrary sector size, and wherein software layers on the tester processor perform computations to be able control data flow between the tester processor and sectors of arbitrary size in the DUT.


