Atom Probe Spectrum Prediction Range for Element Detection

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Solution Overview

Problem

Atom probe devices face challenges in accurately detecting elements with small quantities due to dispersed isotope ratios, leading to potential false negatives where elements are incorrectly identified as not present in the sample.

Innovation Solution

A material inspection apparatus and method that generates a spectrum prediction range based on simulations to compare with actual detection results, improving the probability of determining element presence and quantity by displaying actual spectrums and prediction ranges for accurate analysis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If isotope ratio comparison method is used to identify elements, then element identification accuracy is improved for abundant elements, but false negatives increase for elements present in small amounts

Engineering Contradiction:
Improveelement identification accuracyVSAvoidfalse negative rate
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The system performs preliminary simulation calculations to predict the spectrum range before comparing with actual detection results. This preliminary action establishes expected value ranges for elements, allowing the system to account for statistical dispersion in isotope ratios and prevent false negatives when elements are present in small amounts.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The invention changes the identification approach from using fixed natural isotope ratios to using dynamically calculated spectrum prediction ranges. By simulating various detection scenarios and establishing parameter ranges (minimum/maximum values) for element presence, the system adapts to the statistical variability inherent in detecting small amounts of elements.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If strict isotope ratio matching is applied, then detection precision is improved, but probability of detecting elements in small amounts decreases

Engineering Contradiction:
Improvedetection precisionVSAvoiddetectable element quantity
Core Design Contradiction:
Measurement precisionVSQuantity of substance

Solution Approach 1:

The system performs preliminary simulation calculations to predict the spectrum range before comparing with actual detection results. This preliminary action establishes expected value ranges for elements, allowing the system to account for statistical dispersion in isotope ratios and prevent false negatives when elements are present in small amounts.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

Instead of requiring exact matching of isotope ratios, the system applies partial matching by accepting values within a predicted range. This relaxed criterion allows detection of elements even when the detected isotope ratio falls outside the strict natural ratio, thereby increasing the detectable quantity of elements present in small amounts.

Inventive Principle:
Principle #16Partial or excessive action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enhances the detection accuracy of elements by reducing false negatives and providing a higher probability of determining element presence and quantity, especially for elements present in small amounts, by using spectrum prediction ranges generated from simulation data.

Implementation Method 1

An atom probe device is an apparatus that ionizes and evaporates atoms on a sample surface by applying a voltage and/or a laser beam to the sample

Methodology Applied
Scientific EffectIonization: Ionisation

Implementation Method 2

An atom probe device is an apparatus that ionizes and evaporates atoms on a sample surface by applying a voltage and/or a laser beam to the sample

Methodology Applied
Scientific EffectLaser ablation: Laser Ablation

Implementation Method 3

The atom probe device identifies a mass-to-charge ratio of each ion by measuring a flight time of the ion from the sample to the mass detector

Methodology Applied
Scientific EffectTime of flight: Time of Flight

Data Source

PatentUS9287104B2Material inspection apparatus and material inspection method
Publication Date: 2016.03.15 KIOXIA CORP
  • US9287104B2 patent drawing
  • US9287104B2 patent drawing
  • US9287104B2 patent drawing

AI summary

A material inspection apparatus according to the present embodiment includes a sample mount capable of mounting a sample. A detector detects an atom desorbed from the sample. A voltage generator applies a voltage to the sample. A laser generator irradiates a laser beam onto the sample. An arithmetic part processes a detection result of the detector. A storage part stores a detection prediction range of a certain element and an isotope of the certain element. A display displays the detection prediction range and an actual detection result of the detector in a comparable manner.