Atomic Absorption Photometer Background Correction Cycle

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Solution Overview

Problem

Current atomic absorption photometer methods for background correction are time-consuming and require multiple samples, as they often necessitate sequential use of different correction techniques like the D2 lamp, Zeeman, and self-reversal methods, leading to varying results and increased sample consumption.

Innovation Solution

An atomic absorption photometer and measurement method that integrates multiple background correction techniques (D2 lamp, Zeeman, and self-reversal) within a single data acquisition cycle, allowing for simultaneous or sequential use of these methods to correct atomic absorption data, reducing sample consumption and analysis time.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple background correction methods (D2 lamp, Zeeman, self-reversal) are used sequentially to achieve accurate background correction, then measurement accuracy is improved, but measurement time and sample consumption increase

Engineering Contradiction:
Improvebackground correction accuracyVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent combines multiple background correction methods (D2 lamp method, Zeeman method, and self-reversal method) into a single integrated system that can execute all three methods within one measurement cycle. The control unit coordinates the operation of D2 lamp, hollow cathode lamp, magnetic field generation unit, and current control unit to perform all correction methods sequentially or simultaneously, then compares results to determine the optimal correction value, thereby achieving accurate background correction without requiring multiple separate measurement cycles.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The measurement system is designed with multi-functionality to support multiple background correction methods using the same hardware components. The hollow cathode lamp serves both as the primary light source for atomic absorption measurement and as a source for self-reversal method. The magnetic field generation unit can be activated to provide Zeeman effect when needed. This universal design allows the system to adaptively select and execute different correction methods based on sample characteristics without requiring separate dedicated hardware for each method.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Reliability

If multiple background correction methods are used sequentially to ensure accurate correction, then correction reliability is improved, but sample consumption increases

Engineering Contradiction:
Improvecorrection reliabilityVSAvoidsample consumption
Core Design Contradiction:
ReliabilityVSLoss of substance

Solution Approach 1:

The patent merges multiple background correction methods into a single measurement cycle, allowing all correction calculations to be performed on the same sample data set. The control unit executes D2 lamp method, Zeeman method, and self-reversal method using measurements taken during one atomization event, then compares the correction values from all three methods to determine the final corrected absorbance. This eliminates the need to consume additional samples for validating different correction approaches.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The system implements feedback by comparing correction values from multiple methods and using this comparison to select the optimal correction result. The control unit evaluates the correction values obtained from D2 lamp method, Zeeman method, and self-reversal method, and determines the final background correction based on this feedback comparison. This ensures reliable correction while maintaining efficiency, as the feedback mechanism validates the correction accuracy without requiring additional sample consumption.

Inventive Principle:
Principle #23Feedback

3Measurement precision

If multiple background correction methods are implemented with separate measurement cycles, then comprehensive correction is achieved, but productivity decreases

Engineering Contradiction:
Improvecomprehensive background correctionVSAvoidmeasurement efficiency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent merges multiple background correction methods into a single integrated measurement cycle. The control unit coordinates the operation of all light sources (hollow cathode lamp and D2 lamp), the magnetic field generation unit, and the current control unit to execute D2 lamp method, Zeeman method, and self-reversal method within one atomization event. All correction calculations are performed using data from this single measurement cycle, eliminating the need for separate measurement cycles for each correction method and thereby maintaining high measurement efficiency.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The system maintains continuous useful action by performing all background correction measurements and calculations within a single uninterrupted measurement cycle. The atomization process generates atomic vapor that is simultaneously used for all three correction methods without interruption. The control unit continuously monitors and processes signals from all light sources and the magnetic field unit, performing all correction calculations in sequence within the same measurement window, thereby maximizing productivity while achieving comprehensive background correction.

Inventive Principle:
Principle #20Continuity of useful action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables efficient background correction in a shorter time frame by utilizing multiple methods in a single cycle, thereby reducing sample consumption and allowing for quicker selection of optimal measurement conditions.

Implementation Method 1

an atomization unit which generates atomic vapor by atomizing a sample

Methodology Applied
Scientific EffectAtomization: Evaporation

Implementation Method 2

when atomic vapor is irradiated with a measuring beam from such a light source, since light of a specific wavelength is absorbed in the atomic vapor

Methodology Applied
Scientific EffectAtomic absorption: Absorption (EM radiation)

Implementation Method 3

a light source which emits a continuous spectrum is used in addition to a light source which emits, for example, a bright line spectrum

Methodology Applied
Scientific EffectContinuous spectrum emission:

Implementation Method 4

by generating a magnetic field at the atomization unit from a magnetic field generation unit such as an electromagnet

Methodology Applied
Scientific EffectZeeman effect: Zeeman Effect

Implementation Method 5

the detector acquires measurement data by detecting light having passed through the atomization unit

Methodology Applied
Scientific EffectPhotodetection: Photoelectric Effect

Data Source

PatentUS10184886B2Atomic absorption photometer and atomic absorption measurement method
Publication Date: 2019.01.22 SHIMADZU CORP
  • US10184886B2 patent drawing
  • US10184886B2 patent drawing
  • US10184886B2 patent drawing

AI summary

There are provided an atomic absorption photometer and an atomic absorption measurement method which can easily perform background correction in a short time period by using a plurality of types of methods while suppressing the amount of samples consumed. Background correction is performing by using each of the D2 lamp method, the Zeeman method, and a self-reversal method, according to measurement data in each of measurement periods T41 to T46 obtained in one data acquisition cycle. Background correction is performed on the common measurement data (atomic absorption data) obtained in the atomic absorption measurement period T41, by using the measurement data (background data) obtained in each of the first to third background measurement periods T44, T46, and T42.