Mapping Atomic-Scale Wave Functions to Effective Mass Models

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Solution Overview

Problem

Current methods struggle to accurately extract effective mass models from complex band structure data of confined nanodevices, as existing systems cannot handle the interleaved band structures of these devices, making it difficult to simulate their behavior effectively in TCAD tools.

Innovation Solution

A method is developed to generate an approximate band structure model by mapping atomic-scale wave functions and eigenenergies from First Principles Methods to effective mass models, using a curve-fitting process to match and identify interleaved band ladders, enabling a more precise simulation of confined nanodevices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If effective mass approximation is used to describe band structure, then computational speed is improved, but accuracy deteriorates for confined nanodevices

Engineering Contradiction:
Improvecomputational speedVSAvoidband structure accuracy
Core Design Contradiction:
SpeedVSMeasurement precision

Solution Approach 1:

The method segments the complex band structure into multiple interleaved band ladders, each representing a subset of bands. By treating each ladder separately with effective mass approximation while maintaining the ability to combine them, the method achieves both computational efficiency and accuracy for confined nanodevices where single-parabola approximations fail.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent employs a composite modeling approach by combining multiple effective mass models (one for each band ladder) to represent the overall band structure. This composite model captures the complex behavior of confined systems while retaining the computational advantages of effective mass approximation, unlike single-model approaches.

Inventive Principle:
Principle #40Composite materials

2Ease of manufacture

If bulk material parameters are used for confined devices, then ease of manufacture is improved, but reliability deteriorates

Engineering Contradiction:
Improveparameter extraction easeVSAvoiddevice simulation reliability
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The method applies local quality by assigning different effective mass parameters to different band ladders based on their specific characteristics. Each band ladder receives customized parameters fitted to its local band structure features, rather than using uniform bulk material parameters, thereby improving simulation reliability for confined devices while maintaining practical parameter extraction procedures.

Inventive Principle:
Principle #3Local quality

3Measurement precision

If atomic-scale modeling is used to generate band structure data, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improveband structure precisionVSAvoiddata processing complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the complex atomic-scale band structure data into multiple manageable band ladders. This segmentation reduces the complexity of processing by organizing the data into distinct groups that can be treated separately, while preserving the high precision information from atomic-scale calculations.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The method extracts key parameters (effective mass, band edges, non-parabolicity coefficients) from the complex atomic-scale band structure data for each band ladder. By extracting only the essential parameters needed for device simulation rather than processing the complete atomic-scale data, the method reduces computational complexity while maintaining precision.

Inventive Principle:
Principle #2Taking out (Extraction)

4Measurement precision

If multiple band ladders are present in confined systems, then accuracy is improved, but difficulty of detecting and measuring increases

Engineering Contradiction:
Improveband structure description accuracyVSAvoidinterleaved band structure analysis difficulty
Core Design Contradiction:
Measurement precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The patent addresses the difficulty of analyzing interleaved band structures by segmenting them into distinct band ladders. Each ladder is identified and characterized separately, making the detection and measurement process manageable despite the complexity of having multiple interleaved bands in confined systems.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS11023639B2Systems and methods for providing approximate electronic-structure models from calculated band structure data
Publication Date: 2021.06.01 SYNOPSYS INC
  • US11023639B2 patent drawing
  • US11023639B2 patent drawing
  • US11023639B2 patent drawing

AI summary

Computer-aided methods for simulating confined nanodevices are disclosed. In example implementations, atomic-scale model of the nanodevices are generated so that dimensions and materials are specified. Then, band structures which comprise wave functions and Eigen energies are calculated using First Principles Methods (FPM). Effective mass modeled which comprise wave functions and Eigen energies are generated. After that, spatial wave functions of the calculated FPM band structures are mapped to the generated effective mass band structures wave functions by considering global behavior. In response to the mapping, generated effective mass models are fitted to calculated FPM energies so that approximate electronic band structures of the confined nanodevices are modeled. Computer programs for carrying out the methods, data media and computer systems are also disclosed.