Autofocus Microscopy via Refractive Index Detection

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Solution Overview

Problem

Existing autofocus techniques in microscopy fail to accurately maintain focus when samples are on substrates with inconsistent thickness, leading to off-focus images due to refractive index changes between plastic and liquid media.

Innovation Solution

An autofocus microscope apparatus using a light source, fiber optic circulator, optical collimator, and microprocessor to process analog voltage signals from reflected light, allowing for precise adjustment of the microscopy stage to achieve optimal focus by analyzing voltage peaks and position feedbacks.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Extent of automation

If autofocus techniques measure distance from the front lens to the bottom of the container using light reflection, then automatic focus adjustment is achieved, but focus accuracy deteriorates when the container has inconsistent thickness

Engineering Contradiction:
Improveautomatic focus adjustmentVSAvoidfocus accuracy
Core Design Contradiction:
Extent of automationVSMeasurement precision

Solution Approach 1:

The patent introduces an intermediary measurement approach by detecting the refractive index change at the plastic-liquid interface rather than directly measuring physical distance. The light reflection technique is used as an intermediary to detect the optical property change, which then serves as a proxy for determining the actual sample focus position, resolving the contradiction between automation and precision.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the measurement parameter from physical distance (which varies with substrate thickness) to refractive index (which is consistent regardless of substrate thickness). By measuring the optical property change at the interface between plastic substrate and liquid medium, the system achieves focus accuracy that is independent of substrate thickness variations.

Inventive Principle:
Principle #35Parameter changes

2Adaptability or versatility

If the substrate thickness varies, then adaptability to different samples is improved, but image focus quality deteriorates

Engineering Contradiction:
Improvecompatibility with varying substrate thicknessVSAvoidimage focus quality
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The patent changes the measurement parameter from physical distance to refractive index, which allows the system to adapt to varying substrate thickness while maintaining consistent focus quality. The refractive index measurement is inherently independent of the physical path length through the substrate.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces the mechanical distance measurement approach with an optical measurement approach based on refractive index detection. This substitution allows the system to handle mechanical variations in substrate thickness without compromising optical focus quality.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Ease of manufacture

If light reflection off the first surface is used for focus measurement, then simple implementation is achieved, but measurement accuracy worsens due to substrate thickness deviation

Engineering Contradiction:
Improvesimplicity of implementationVSAvoidfocus measurement accuracy
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent uses light reflection as an intermediary technique to detect refractive index changes rather than directly measuring distance. The reflection provides information about the optical property change at the plastic-liquid interface, which then serves as the basis for focus determination, maintaining simplicity while improving accuracy.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes what parameter is being measured using the light reflection technique - instead of measuring physical distance, the system measures the optical path change caused by refractive index variation. This parameter change allows the simple reflection-based method to provide accurate focus information.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system effectively maintains focus on samples with varying substrate thickness, enhancing image clarity and suitability for high-content screening and biological imaging applications by reducing background noise and improving focus accuracy.

Implementation Method 1

an optical collimator for directing a light output from the second port of the fiber optic circulator onto a sample through a Dichroic mirror and a microscope objective

Methodology Applied
Scientific EffectRefraction: Refraction

Implementation Method 2

a balance detector for converting a light signal, reflected off of a substrate that the sample is placed on, into an analog voltage signal

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS9201232B2Autofocus apparatus
Publication Date: 2015.12.01 THORLABS INC
  • US9201232B2 patent drawing
  • US9201232B2 patent drawing
  • US9201232B2 patent drawing

AI summary

An autofocus apparatus includes, in one embodiment, a light source; a splitter; a fiber optic circulator; an optical collimator; a balance detector; and a microprocessor. The fiber optic circulator couples one of the split light signals at a first port, to the optical collimator at a second port, and to the balance detector at the third port. The optical collimator directs the light beam from the fiber optic circulator onto a sample through a Dichroic mirror and a microscope objective. The balance detector uses another one of the split light signals as an input, and converts a light signal, reflected off of a substrate the sample is placed on, into an analog voltage signal. The microprocessor processes the output of the balance detector and position feedbacks from an adjustable microscopy stage to generate a command for moving the position of the adjustable microscopy stage to achieve a desired focus.